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环保型铜粉导电胶的研制
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摘要
本实验分别以双酚A型环氧树脂和咪唑为基体胶和固化剂,甲醛为还原剂,邻苯二甲酸二丁酯为增塑剂,用铜粉(300目)作导电填料,添加适当的偶联剂和稀释剂,制备了各向同性铜粉导电胶。通过L9(34)正交优化实验,获得了制备铜粉导电胶的最佳质量比。实验研究得到了偶联剂的种类及用量、导电填料的质量分数、晾置时间、固化温度和固化时间等因素分别对其导电性能和力学性能影响的一般规律。
     通过红外光谱分析(FTIR)得出了环氧树脂与咪唑间的最佳固化质量分数比,借助X射线能谱仪(EDS)分析了铜粉预处理前后含氧量的差异,用扫描电镜(SEM)观察了铜粉包覆硅烷偶联剂后分散性的变化,采用X衍射(XRD)和热重分析(TG)验证了硅烷偶联剂能显著提高微米级铜粉的抗氧化性能,利用万能数字电表、拉伸机、烘箱和恒温恒湿水浴箱分别检测了铜粉导电胶的体积电阻率、剪切强度和抗老化性能。实验结果表明:
     (1)当m(环氧树脂):m(咪唑)=100:8,m(偶联剂):m(铜粉)=1%,m(还原剂):m(铜粉)= 6%,铜粉添加量为整个体系质量的65%,且添加钛酸酯偶联剂时,制备的各向同性铜粉导电胶试样的体积电阻率可达1.5×10-3/Ω·cm,剪切强度为5.52 MPa。经6个月自然老化后,其体积电阻率为3.3×10-3/Ω·cm,且在180℃的高温下具有较好的稳定性和抗氧化性能,但在50℃85%RH湿热条件下的抗老化性能逊色。
     (2)以上述成分和比例制备的导电胶体系的渗流阈值是65%,低于该值时,铜粉导电胶的导电性随着铜粉质量分数的增大而增大,但剪切强度却相反,随着铜粉质量分数的增大而降低。此外,各个成分及用量对其性能的影响也不一样。
     (3)实验表明,固化温度为120℃时间为3h时能获得性能较好的导电胶,且固化前适当的晾置对于提高导电性能和力学性能同样有益。
     (4)SEM检测结果表明,硅烷偶联剂对提高铜粉的分散性有一定作用,但效果不是很明显。
     (5)XRD和TG检测分析表明,用硅烷偶联剂对铜粉进行改性的方法的确能提高铜粉的高温抗氧化性能。
For the copper-filled isotropic conductive adhesives formulation, we used bisphenol-A type epoxy resin, imidazole as curing agent for the system and incorporating formaldehyde as reducing agent, along with dibutyl phthalate and silane couple agent, and adding Cu powders of 45μm diameter as conductive fillers. Optimal properties of Cu-filled ICAs were achieved by the L9(34) orthogonal experiments. In addition, the factors and their effects on the properties of conductive and mechanics were studied through adding different kinds of silane couple agent, weight percents of Cu, curing time and curing temperature, respectively.
     The optimal ratio between epoxy rein and imidazole was achieved by FTIR. The contents of oxygen on the surface of Cu powders before treated and after were determined by X-ray spectrometer. And the surface of the samples before and after coating silane couple agent were observed by SEM. In addition, X-ray diffractometer and thermo gravimetric analysis were applied to analyze the anti-oxidant property of Cu before they were coated silane couple agent and after. The bulk resistivity, shearing strength and aging performence were characterized by digital multimeter, stretcher and oven,respectively. The experiment results can be summarized.
     (1)The Cu-filled ICAs with their bulk resisvivity and shearing strength were 1.5×10-3/Ω·cm and 5.52 Mpa respectively when the ratio between epoxy rein and imidazole was 100:8, the percent of titanate couple agent was 1% and formaldehyde was 6%, and adding Cu up to 65 wt.%. After aging for 6 months under natural conditions, the bulk resisvivity can remain at 3.3×10-3/Ω·cm. In addition, the samples had good conductive property even exposed at 180 degrees. However, their properties under 50℃85%RH were poor.
     (2)The percolation threshold of ICAs is 65 wt.%. The conductivity of the samples increases with the percents of Cu and shearing strength decreases on the contrary. And the main factors which effected on the properties of Cu-filled ICAs were different.
     (3)The experiment showed that the optimal cuing process was 120℃for 3 h.
     (4)The result of SEM showed that silane couple agent may has a protective effect against some reunion, however, the protection of silane couple agent is not effective.
     (5)The results of XRD and TG showed that the anti-oxidant property of Cu after coated silane couple agent was really better than the untreated due to the polymer of silane couple agent had high thermal stability even exposed under hing temprature.
引文
[1]陈建军,邱浩孟,李和昌.导电胶粘剂的研究发展现状[J].粘接,2009(8):68-69.
    [2] A.Damasceni,L.Dei,F.Guasti.Thermal Behaviour of Silver-filled Epoxy Adhesives Technological implications in microelectronics[J].Thermal Analysis and Calorimetry,2001,66,223-232.
    [3]向昊,曾黎明,胡传群.各向异性导电胶的研究与应用现状[J].粘接,2008,29(10):42-43.
    [4] Sung K. Kang. Development of Lead(Pb)-free Interconnection Materials for Microelectronics[J]. Journal of Metals and Materials,1999,5(6):545-549.
    [5] M.Inoue, K.Suganuma.The Dependence on Thermal History of the Electrical Properties of an Epoxy-Based Isotropic Conductive Adhesive[J].Electronic Materials,2007,36(6):669-670.
    [6]孙欢,虞鑫海,徐永芬.国内外导电胶的发展现状[J].粘接,2007,29(3):37-38.
    [7] Jong-Woong Kim,Young-Chul Lee,Seung-Boo Jung. Effect of Bonding Conditions on Conduction Behavior of Anisotropic Conductive Film Interconnection[J]. Journal of Metals and Materials International, 2008,14(3):373-374.
    [8] F.M.Coughlan, H.J.Lewis. A Study of Electrically Conductive Adhesives as a Manufacturing Solder Alternative[J]. Journal of Electronic Materials,2006,35(5):912-913.
    [9]段国晨,齐暑华,吴新明.微电子封装用导电胶的研究进展[J].中国胶粘剂,2010,19(2):54-55.
    [10]陈洪江,虞鑫海,刘万章.导电胶的应用现状[J].粘接,2008,29(11):37-38.
    [11]王洪波,陈大庆,薛峰.环氧导电银胶在LED上的应用现状[J].中国胶粘剂,2007,16(6):53-55.
    [12]杨颖,王守绪,何为,等.金属粉末-聚合物复合导电胶研究进展[J].表面安装技术,2009,3:65-66.
    [13]武永才.黑瓷熔封工艺中导电胶与芯片厚度的研究[J].电子与封装,2009,9(4):13-15.
    [14]钟建华,欧阳玲玉,陈丙璇.导电胶的研究与应用[J].化学与黏合,2005,27(6):373 -374.
    [15]林鞯,于朝生.还原石墨导电胶的研究[J].中国胶粘剂,2008,17(11):20-22.
    [16] K.L.Chan,M.Mariatti,Z.Lockman,et.al. Effect of ulrtasonication medium on the properties of copper naoparicle-filled epoxy composite for electrical conductive adhesive application[J]. Materials of Science,2010,21(8):772-778.
    [17] Y. C. Lin, Jue Zhong. A review of the influencing factors on anisotropic conductive adhesives joining technology in electrical applications[J]. Materials of Science,2008,43(9):3073–3074.
    [18]孙丽荣,王军,黄柏辉.导电胶粘剂的现状与进展[J].中国胶粘剂,2003,13(3):60-61.
    [19]谢明贵,郭丹,黄艳,等.无铅电子组装材料-导电胶的研究进展[J].精细化工,2008, 25(11):1061-1062.
    [20] Jong-Woong Kim,Young-Chul Lee,Seung-Boo Jung. Reliability of Conductive Adhesives as a Pb-free Alternative in Flip-Chip Applications[J]. Electronic Materials ,2008,37(1):9-10.
    [21]张晓波,姜岩峰.新一代导电胶材料接触电阻稳定性研究[J]. 2006,6(10):5-7.
    [22] Yi Li,Kyoung-Sik Moon,C.P.Wong. Adherence of Self-Assembled Monolayers on Gold and Their Effects for High-Performance Anisotropic Conductive Adhesives[J]. Electronic Materials,2005,34(3):266-267.
    [23]李芝华,孙健,柯于鹏.导电胶粘剂的导电机理研究进展[J].高分子通报,2009(7),53-59.
    [24]吴海平,吴希俊.电子元件封装用导电胶的研究进展[J].材料导报,2004,18(6):84-85.
    [25] Ruschau G R,Yoshikawa S,Newnham R E. Resistivities of Conductive Composites [ J]. Journal of Applied Physics,1992,72(3):953-959.
    [26]代凯,施利毅,方建慧,等.导电胶粘剂的研究进展[J].材料导报,2006,20(3):116-118.
    [27]马瑞.改性环氧树脂导电胶粘剂的研制[J].电讯工程,2008(2):32-33.
    [28]许佩斯,陈治中,谢文明.铜导电胶电性能的研究[J].1998,16(1):75-76.
    [29] LiL, Morris JE. Electrical conduction models for isotropically conductive adhesive joints[J]. Transactions on Components Packaging and Manufacturing Technology,1997,20(1):3-8.
    [30] Masahiro Inoue, Katsuaki Suganuma. Influential factors in determining the adhesive strength of ACF joints[J]. Materials in Electronics,2009,20(12):1247-1253.
    [31] Jun Xiao,D.D.L.Chung.Thermal and Mechanical Stability of Electrically Conductive Adhesive Joints[J]. Electronic Materials,2005,34(5):625-628.
    [32] H.Yu,S.G. Mhaisalkar, E.H.Wong.Cure Shrinkage Measurement of Nonconductive Adhesives by Means of a Thermomechanical Analyzer[J]. Electronic Materials,2005,34(8):1177-1182.
    [33]李广宇,李子东,吉利,等.环氧胶黏剂与应用技术[M].北京:化学工业出版社,2007:447-448.
    [34]路庆华,和田弘.新型导电胶的研究(I)[J].1997,28(5):546-547.
    [35]路庆华.新型导电胶的研究(1I)耐银迁移导电胶的研究[J].功能材料,1998,29(4):439-440.
    [36]梁浩,解芳.镀银铜粉导电填料对复合型导电涂料性能影响的研究[J].涂料工业, 2001,31(7):1-3.
    [37]程原,高保娇,梁浩.微米级镀银铜粉复合导电涂层的导电性研究[J].应用基础与工程科学学报, 2001,9(2-3):184-185.
    [38]张聚国,付求涯.镀银铜粉导电胶的研究[J].表面技术,2007,36(4):28-29.
    [39]彭舒,唐振方,周序乐.镀银铜粉导电电子浆料的研究[J].科学技术与工程2007,7(9):1868-1869.
    [40]吴懿平,吴大海,袁忠发,等.镀银铜粉导电胶的研究[J].电子元件与材料,2005,24(4):32-35.
    [41]孙春桃,吴士筠.纳米银包覆铜粉体的制备及其导电性能研究[J].化学与生物工程,2003,20(6):27-28.
    [42]朱华,甘复兴.铜银系导电复合材料腐蚀失效研究[J].中国腐蚀与防护学报,2005,25(4):245-248.
    [43] Li-Ngee Ho,Hiroshi Nishikawa,Naohide Natsume. Effects of Trace Elements in Copper Fillers on the Electrical Properties of Conductive Adhesives[J]. Electronic Materials, 2010,39(1):115-116.
    [44]彭舒,唐振方,吉锐.电子浆料中微米级铜粉的抗氧化研究[J].表面技术,2008,37(3):6-8.
    [45]何益艳,范修涛,陆瑞卿,等.铜粉表面包覆硅烷偶联剂改性研究[J].腐蚀与防护,2006,27(2):69-70.
    [46] Yi LiI,Kyoung-Sik Moon,C.P. Wong. Monolayer-Protected Silver Nano-Particle-Based Anisotropic Conductive Adhesives: Enhancement of Electrical and Thermal Properties[J]. Journal of Electronic Materials,2005,34(12):1573-1578.
    [47] Hongjin Jiang,Kyoung-Sik Moon,Jiongxin Lu,et al. Conductivity Enhancement of Nano Silver-Filled Conductive Adhesives by Particle Surface Functionalization [J]. Journal of Electronic Materials,2005,34(11):1432-1435.
    [48]路庆华,Sasaki Akihiro.新型导电胶的研究(Ⅲ)导电胶中铜表面的防氧化研究[J].功能材料,1998,29(4):442-443.
    [49] Myungjin Yim,Yi Li,Kyoung Sik Moon. Oxidation Prevention and Electrical Property Enhancement of Copper-Filled Isotropically Conductive Adhesives [J].Electronic Materials,2007,36(10):1341-1347.
    [50]刘运学,王晓丹,谷亚新,等.铜粉添加型导电胶的研制[J].中国胶粘剂,2008,17(11):27-28.
    [51] Masahiro Inoue, Hiroaki Muta,Takuji Maekawa,et al. Temperature Dependence of Electrical and Thermal Conductivities of an Epoxy-Based Isotropic Conductive Adhesive [J]. Journal of Electronic Materials,2008,37(4):462-468.
    [52] Masahiro Inoue,Hiroaki Muta,Shinsuke Yamanaka,et al. Electrical Properties of Isotropic Conductive Adhesives Composed of Silicone-Based Elastomer Binders Containing Ag Particles[J]. Electronic Materials,2009,38(9):2013-2022.
    [53]李子东,李春惠,李广宇,等.如何受益硅烷偶联剂的奇妙功效[J].粘接,2009,(7):33-34.
    [54]曾昭琼.有机化学[M].北京:高等教育出版社,2006:194-195.
    [55]蔡燕莎.导电胶电阻率的测试方法[J].中国仪器仪表,1995(5):30-31.
    [56] H.P. Wu,J.F. Liu,X.J. Wu,et al. High conductivity of isotropic conductive adhesives filled with Silve rnano wires[J]. Adhesion & Adhesives, 2006,26:617-621.
    [57]梁彤祥,马文有,曹茂盛.SiO2纳米粒子对铜导电胶连接强度的影响[J].高分子材料科学与工程,2005,21(1):225-227.
    [58]巫建华,李佳,王岩.各向异性导电胶粘结工艺技术研究[J].电子与封装,2010,10(1):11-13.
    [59]高玉,余云照.导电胶固化过程中导电网络形成的机理[J].粘接,2004,25(6):1-2.
    [60]秦连城.导电胶导电性能的实验研究[J].光学精密工程,2005,(z1):114-118.
    [61] Zhimin Mo,Xitao Wang,Tiebing Wang. Electrical Characterization of Isotropic Conductive Adhesive under Mechanical Loading [J]. Electronic Materials,2002,31(9):916-920.
    [62]刘运吉,杨道国,秦连城.固化工艺参数对导电胶导电性的影响[J].电子元件与材料,2005,24(10):20-26.
    [63] J.H. Zhang,Y.C. Chan. Research on the Contact Resistance, Reliability, and Degradation Mechanisms of Anisotropically Conductive Film Inter connection for Flip-Chip-on-Flex Applications[J]. Electronic Materials,2008,32(4):228-234.
    [64] Sung K.Kang,S.Purushothaman. Development of Conducting Adhesive Materials for Microelectronic Applications[J]. Electronic Materials,1999,28(11):1314-1316.
    [65]高保娇,高建峰,蒋红梅,等.微米级铜-银双金属粉镀层结构及其抗氧化性[J].物理化学报,2000,16(4):367-368.
    [66]毋伟,陈建峰,卢寿慈.超细粉体表面修饰[M].北京:化学工业出版社,2004:166-167.
    [67]柯扬船.聚合物纳米复合材料[M].北京:科学出版社,2009:199-200.
    [68]吴丰顺,郑宗林,吴懿平,等.倒装芯片封装材料-各向异性导电胶的研究进展[J].电子工艺技术,2004,25(4):139-141.
    [69]陈党辉,顾瑛,陈曦.国外微电子组装用导电胶的研究进展[J].电子元件与材料,2002,21(2):36-37.
    [70]雷芝红,贺英,高利聪.微电子封装用导电胶的研究进展[J].微纳电子技术,2007,44(1):47-48.
    [71]常英,徐长富,刘刚.紫外光固化导电胶的老化性能研究[J].中国胶粘剂,2005,14(11):16-17.
    [72] Liu Johan,Lu Xiu-zhen,Cao Li-qiang. Reliability aspects of electronics packaging technology using anisotropic conductive adhesives[J]. Journal of Shanghai University,2007,11(1):1-16.

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