摘要
创新性地提出了采用SAR成像技术对微波暗室内壁剩余强散射点进行二维成像诊断,建立了相应的成像模型,选取了时域B-P算法作为成像算法,并对该算法在暗室内成像进行了仿真验证。仿真结果表明,时域B-P算法能够获得暗室内壁剩余强散射点分布的高分辨率、高精度二维像。采用SAR成像技术实现微波暗室内壁的二维成像诊断对经济、有效地提高暗室电性能具有实际的意义。
Put forward a method of using SAR imaging technology to process 2D imaging diagnosis about strong scattering points in inner walls of microwave chamber innovatively, build the corresponding imaging model, select time-domain B-P algorithm as the imaging algorithm, and verify the algorithm for imaging about chamber by simulating. The results of simulation show that, time-domain B-P algorithm can obtain high-resolution and high-precision 2D image of the distribution of residual strong scattering points in inner walls of chamber. Using SAR imaging technology to achieve 2D imaging diagnosis of inner walls of chamber has practical meaning in improving the electrical performance of chamber economically and effectively.
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