作者单位:WU Jian-fen,HE Miao,ZHOU Chao,HU Xue-qiang(Central Iron and Steel Research Institue, Beijing, 10084, China ; NCS Testing Technology Co. , Ltd. , Beijing, 100084,China)武建芬,何淼,周超,胡学强(钢铁研究总院,北京,100084;钢研纳克检测技术有限公司,北京,100084)WANG Yu(Institute of Electronics, Chinese Academy of Sciences, Beiing, 100190, China)王宇(中国科学院电子学研究所,北京,100190)