Dislocation characterization in fatigued Cu with nanoscale twins

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• 作者：Qingsong Pan ; Lei Lu
• 刊名：Science China Materials
• 出版年：2015
• 出版时间：December 2015
• 年：2015
• 卷：58
• 期：12
• 页码：915-920
• 全文大小：757 KB
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• 作者单位：Qingsong Pan (1)
  Lei Lu (1)
  
  1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, 110016, China
  
• 刊物类别：Materials Science, general; Chemistry/Food Science, general;
• 刊物主题：Materials Science, general; Chemistry/Food Science, general;
• 出版者：Science China Press
• ISSN：2199-4501

文摘

Previous studies have shown that strain-controlled cyclic stability was maintained in bulk Cu samples with highly oriented nanoscale twins. In order to explore the underlying fatigue mechanism, transmission electron microscopy observations under two-beam diffraction condition were utilized to characterize the dislocation configurations in the twin/matrix layers of as-fatigued nanotwinned Cu. It was clarified that the threading dislocations with Burgers vector parallel to twin boundaries are mainly active during fatigue. A three-dimensional stereo projection was re-configured for demonstrating the special structure of dislocations in nanoscale twins. 中文摘要 块体择优取向纳米孪晶Cu在应变疲劳时保持循环稳定. 为了研究其本征疲劳机制, 本文利用透射电子显微镜在双束条件下 研究了纳米孪晶Cu疲劳后孪晶片层内位错形貌特征. 结果表明纳米孪晶Cu的疲劳变形多由受限于孪晶片层内部的滑移方向平行于孪晶界面、 滑移面倾斜于孪晶界面的单滑移贯穿位错主导. 通过三维投影模型重构了贯穿位错在纳米孪晶片层内的空间分布.