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一种光电子能谱费米面拼接方法
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  • 英文篇名:A METHOD OF STITCHING FERMI SURFACE BY PHOTOEMISSION SPECTROSCOPY
  • 作者:贾小文 ; 周兴江
  • 英文作者:JIA Xiaowen;ZHOU Xingjiang;General Course Department,Military Transportation University;Institute of Physics,Institute of Physics in Chinese Academy of Sciences;
  • 关键词:费米面 ; 角分辨光电子能谱 ; 数据拼接
  • 英文关键词:Fermi surface;;angle-resolved photoemission spectroscopy;;data stitching
  • 中文刊名:GKWL
  • 英文刊名:Physics and Engineering
  • 机构:陆军军事交通学院基础部;中国科学院物理研究所超导实验室;
  • 出版日期:2018-12-13 14:03
  • 出版单位:物理与工程
  • 年:2019
  • 期:v.29;No.191
  • 基金:陆军军事交通学院博士启动经费(41741107)
  • 语种:中文;
  • 页:GKWL201903016
  • 页数:5
  • CN:03
  • ISSN:11-4483/O3
  • 分类号:82-86
摘要
光电子能谱技术可以直接探测材料的费米面结构,是研究材料电子结构的重要实验手段。由于光源光子能量、探测器探测角度范围以及材料本身的因素,光电子能谱技术一次只能探测布里渊区一个位置区域的费米面信息。本文提出一种将不同位置区域测量的费米面拼接起来的方法:首先根据费米面结构特征对费米面进行配准,以其中一个费米面为基准,求出仿射变换矩阵,然后对费米面进行二值化,求出测量区域轮廓,最后以到测量区域轮廓的距离作为权重将两费米面重叠区域按照像素进行拼接融合,非重叠区域保持不变。与直接相加相比,这种方法可以有效融合重叠区域,消除边界处的不连续性,获取完整费米面,提高数据质量。本文提到的方法可以从数据处理的角度弥补角分辨光电子能谱在探测范围上的不足。
        Photoemission spectroscopy can directly probe the Fermi surface and serves as a key experimental tool to investigate electronic structure of materials.Considering limitation of photon energy,detector angle and lattice constant of material,angle-resolved photoemission spectroscopy can only detect one specific portion of the Fermi surface once.This paper presents a method of stitching the Fermi surfaces of the same sample measured in different momentum space.Firstly,the Fermi surfaces are registered according to the structural features and the affine transformation matrix is obtained based on one of the Fermi surfaces.Then the Fermi surface is binarized to obtain the boundary contour.Finally,the overlapping areas of the two Fermi surfaces are fused taking the distance from the pixel to Fermi surface boundary contour as the weight factor.The un-overlapping regions remain unchanged.Compared to adding the two Fermi surfaces directly,this method can eliminate the dis-continuity at the boundary effectively and merge the Fermi surfaces finely without degrading of data quality.This method is a compensation of the limited probing ability of angle-resolved photoemission spectroscopy from the aspect of data sets processing and analyzing.
引文
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