用户名: 密码: 验证码:
直接感光法BST薄膜图形制备及其性能的研究
详细信息    本馆镜像全文|  推荐本文 |  |   获取CNKI官网全文
摘要
BST由于其良好的铁电、介电、热释电性及绿色环保性,被广泛的应用于动态随机存储器DRAM、红外传感器UFPA、非挥发性存储器FeRAM等铁电集成领域。对于铁电集成器件的应用,不仅要求一定的膜厚,而且需要特定的图形,因此,适应特定铁电器件膜厚和图形需求的图形化薄膜的制备技术,对于铁电器件的发展具有重要的理论意义和实用价值。
     本课题针对DRAM、UFPA和FeRAM器件应用的典型膜厚需求,在化学修饰的溶胶-凝胶工艺的基础上,引入PVP改性剂,采用直接感光法单次制备得到了介电性能良好的BST图形化薄膜。研究发现:(1)采用乙酸钡、乙酸锶、钛酸丁酯为出发原料,以醋酸与甲醇为溶剂,以乙酰丙酮为化学修饰剂,以PVP为开裂抑制剂,能够合成制备具有紫外感光特性的BST溶胶,溶胶浓度约为0.7-0.8mol/L,紫外敏感波长约为325nm,单次制备的BST图形化薄膜:其介电常数约为600,介电损耗约为0.03;(2)PVP的引入提高了单次制备的BST薄膜厚度,抑制了薄膜开裂,随PVP的添加量不同,单次制备的BST薄膜厚度从200~800nm范围可调,当PVP的添加量与溶剂的质量比达到1:30以上时,可明显抑制BST薄膜的开裂;(3)采用200℃烘干20min→500℃预处理20min→700℃热处理30min→随炉冷却的阶段热处理工艺,有利于发挥PVP添加剂的开裂抑制效果,可以单次制备得到致密的BST钙钛矿相图形化薄膜,厚度可以达到800nm左右。结果表明:采用直接感光法单次制备BST图形化薄膜的方法是可行的。
BST films are widely used in the dynamic random access memory,uncooled focal plane array,non-volatile ferroelectric random access memories and many other fields for their great performance in ferroelectricity,dielectricity,pyroelectricity and environmental protection.For the application in ferroelectric integrated device,the BST film needs a certain thickness and specific film pattern.Therefore,the process of BST film fine patterning with specific thickness has great significance.
     Aiming at the thickness and patterning requirement of DRAM,UFPA,FeRAM application, base on chemical modified Sol-gel process with PVP as additive agent,the patterned BST films with good dielectricity were obtained by direct-patterning and single-dip-coating process.The conclusions are drawn as follows:(1)Using Barium acetate,strontium acetate and tetrabutyl titanate as starting materials,acetic acid and methanol as solvent,acetylacetone as chemical modifier,PVP as additive agent,photosensitive BST sol with concentration of about 0.7-0.8M were synthesized,its sensitive wavelength is about 325nm.The patterned BST films can also prepared by direct-patterning and single-dip-coating process,the dielectric constant and dielectric loss of which are about 600 and 0.03,respectively.(2)Additive PVP can increase the thickness of BST film and suppress cracking tendency,the thickness of BST films can be prepared from 200 to 800nm by adjusting the additive amount of PVP,and the PVP can suppress cracking-tendency at the addition mass ratio PVP and solvent above 1:30.(5;)The stage-by-stage heat treatment process of 200℃→500℃→700℃can exert the suppressing-crack role of PVP.The dense BST patterned films with perovskite structure and thickness of about 800rim were prepared by the method.The results indicate that the direct patterning and single-dip-coating process for BST film patterning is feasible.
引文
[1]朱劲松,吕笑梅,朱旻.铁电存储器[M].清华大学出版社.2004.
    [2]钟维烈.铁电体物理学[M].科学出版社.1996.
    [3]包定华,张良莹,姚熹.铁电薄膜研究的一些新动向[J].高技术通讯.1997,7(4):58-62.
    [4]殷之文.电介质物理学[M].科学出版社.2003:778-780.
    [5]吴自勤,王兵.薄膜生长[M].科学出版社.2001.
    [6]F.M.Pontes,E.Longo.Study of the dielectric and ferroelectric properties of chemically processed Ba_xSr_(1-x)TiO_3 thin films[J].Thin Solid Films.2001,386(1):91-98.
    [7]叶扬,丁爱丽,唐新桂等.Ba_(0.7)Sr_(0.3)TiO_3薄膜的制备、结构及性能研究[J].无机材料学报.2002,17(1):125-130.
    [8]符春林,杨传仁等.钛酸锶钡(BST)薄膜的制备与应用研究进展[J].电子元件与材料.2003,22(5):47-50.
    [9]Gene.H.Haertling.Ferroelectric Ceramics:History and Technology[J].Am.Ceram.Soc.1999,82(4):797-818.
    [10]李言荣,晖正中等.电子材料导报[M].清华大学出版社.2001.
    [11]朱小红,朱建国等.铁电钛酸锶钡薄膜的最新研究进展[J].无机材料学报.2003,18(9):989-998.
    [12]Won-Jae Lee,Young-Min Kim,Ho-Gi Kim.Pt-base electrodes and effects on phase formations and electrical properties of high-dielectric thin film[J].Thin Solid Films.1995,269:75-79
    [13]葛水兵.化学计量对Ba_(1-x)Sr_xTiO_3薄膜介电性能的影响[J].苏州大学学报(自然科学版)2005,21(10):58-61.
    [14]A.Ioachima,M.I.Toacsana,M.G.Banciua.Barium strontium titanate-based perovskite materials for microwave applications[J].Progress in Solid State Chemistry.2007,35(2-4)513-520.
    [15]丁文,丁永平,孟中岩.Sol-Gel制备Ba_(1-x)Sr_xTiO_3系铁电薄膜的介电、调谐性能[J].功能材料2001,32(4):388-390.
    [16]S.Ezhilvalavan,Tseung-Yuen Tseng.Progress in the developments of(Ba,Sr)TiO_3(BST)thin films for Gigabit era DRAMs[J].Materials Chemistry and Physics.2000,65(3):227-248.
    [17]Cheol Seong Hwang.(Ba,Sr)TiO_3 thin films for ultra large scale dynamic random access memory.A review on the process integration[J].Materials Science and Engineering.1998,56(2-3):178-190.
    [18]符春林等.钛酸锶钡(BST)薄膜的组成、结构与性能研究进展[J].真空科学与技术.2003,23(4):255-364.
    [19]J.S.Speck,W.Pompea.Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films[J].Appl.Phys.1994,76(1):466-476.
    [20]刘梅冬,曾亦可,姜胜林,刘少波.铁电薄膜热释电非致冷红外传感器研究[J].仪表技术与传感器.2004,(2):3-5.
    [21]钟琪,林殷茵,汤庭鳌.铁电存储器制备中关键工艺的改进[J].微电子学.2000,30(5):351-353.
    [22]吴淼,胡明,王兴.铁电随机存储器的研究进展[J].压电与声光.2003,25(6):472-475.
    [23]刘世建,徐重阳,曾祥斌,赵伯芳.(Ba_(0.7)Sr_(0.3))TiO_3铁电薄膜热敏电容器的研制[J].华中理工大学学报.2000,28(10):70-71.
    [24]金宇龙,周洪庆,吴洪忠,刘敏.钛酸锶钡(BST)铁电移相器材料的研究现状[J].电子元件与材料.2003,22(2):38-40.
    [25]H.V.Alexandrua,C.Berbecarua,A.loachimb.BST solid solutions,temperature evolution of the ferroelectric transitions[J].Applied Surface Science.2006,253(1):354-357.
    [26]Zhimou Xu,Yuichiro Tanushi,Masato Suzuki.Optical properties of amorphous Ba_(0.7)Sr_(0.3)TiO_3 thin films obtained by metal organic decomposition technique[J].Thin Solid Films.2006,515(4):2326-2331.
    [27]于福熹.信息材料[M].天津大学出版社.2000,12,第一版:508-520.
    [28]彭会芬.钛酸钡铁电陶瓷和薄膜的溶胶凝胶法制备及表征[J].材料科学与工程.1998,16(1):64-68.
    [29]http://www.embeddedstar.com/press/content/2002/11/embedded6019.html,"Texas Instruments Eyes Embedded FRAM as Next Generation Non-Volatile Memory Technoligy",11/8/2002.
    [30]陈实,张海波,姜胜林,曾亦可,刘梅冬.热释电非制冷红外焦平面现状及发展趋势[IJ].红外与激光工程.2006,35(4):419-424.
    [31]Jaem o Im,Aucillo O,Baumann P K.Composition-control of magnetron-sputter-deposited Ba_xSr_(1-x)Ti_(1+y)O_(3+z)thin films for voltage tunable devices[J].Appl Phys Lett.2000,76(5):625-627.
    [32]Kim WJ,Chang W,Qadri SB.Microwave properties oftetragonally distorted Ba0.5Sr0.5 TiO3 thin films[J].Appl.Phys.Lett.2000,76(9):1185-1187.
    [33]杜晓松,宋远强.MOD-一种媲美Sol-gel的薄膜制备方法[J].材料导报.2005,19(Ⅳ):213-215.
    [34]谭红,何锦林.用溶胶凝胶法制备PZT铁电体薄膜[J].无机材料学报.1995,10(1):113-116.
    [35]王福平,于艳菊,姜兆华,赵连城.Sol-gel法制备PZT铁电薄膜新进展[J].材料科学与工艺.2001,9(4):442-448.
    [36]曾亦可,刘梅冬,姜胜林,刘少波.BST溶胶-凝胶的化学与热反应过程研究[J].华中科技大学学报(自然科学版).2003,32(11):39-41.
    [37]阎培渝,李龙土,张孝文.工艺参数对Sol-gel法制备的PLZT铁电薄膜结构和性能的影响[J].材料研究学报.1995,9(6):535-538.
    [38]郑伟涛.薄膜材料与薄膜技术[M].化学工业出版社,北京2004.
    [39]Sengupta L C.National Academy of Engineering.Second Annual Symposium on Frontiers of Engineering.Washington D C[C]:National Academy Press.1997,86-90.
    [40]L H Chiu,Sengupta L C.Ceramic ferroelectric composite materials with enhanced electronic properties BSTO-Mg based compound-pare earth oxide[P]US-6074971,2000,6.
    [41]夏冬林,刘梅冬,曾亦可.新型Sol-Gel技术PZT铁电厚膜的制备及电学性能研究[J].无机材料学报.2001,16(11):1156-1160.
    [42]陈书厅,姚熹.新型sol-gel技术制备BST0-3型厚膜[J].电予元件与材料.2005,24(1):19-21.
    [43]张五星,薛丽红.流延法制备钛酸锶钡厚膜[J].压电与声光.2006,28(6):314-316.
    [44]苏滔珑,庄志强.钛酸钡基厚薄膜PTCR的研究[J].陶瓷研究与职业教育.2005,3(2):43-47.
    [45]Kim et al.BST Integration Using Thin Buffer Layer Grown Directly Onto SiO_2/Si Substrate.United States[P]:20060068560
    [46]周晓华,O.Toft.掺镁钛酸锶厚膜氧传感器的敏感机理研究[J].功能材料.1999,30(1):13-15.
    [47]S.Marsona,R.A..Doreya.Direct patterning of photosensitive chemical solution deposition PZT layers[J],of the European Ceramic Society.2004(24):1925-1928
    [48]刘梅冬,曾亦可.Ba_(1-x)Sr_xTiO_3薄膜的制备及性能的研究[J].压电与声光.2001 23(2):41-43.
    [49]姜胜林,曾亦可,刘少波,刘梅冬.改进sol-gel技术BST薄膜的制备及性能研究[J].功能材料.2004,35(3):364-366.
    [50]吴小清,任巍,姚熹.铅基铁电薄膜低温结晶和单层厚度提高及其性能研究[J].四川大学学报.2005,42(2):24-27.
    [51]WANG Zheyao,IU Jiashe,REN Tianling,et al.Fabricationof organic PVP doping-basedBa_(0.5)Sr_(0.5)TiO_3 thickfilms on silicon substratesfor MEMS applications[J].Sensors and Actuators.2005,117(2):293-300.
    [52]刘建设,任天令,刘理天等.硅基衬底Ba_(0.5)Sr_(0.5)TiO_3厚膜制备的Sol-gel新方法[J].半导体学报.2002,23(8):830-834.
    [53]崔英德,黎新明.PVP水凝胶的应用与制备研究进展[J].化工科技综述专论综述专论[R]2002,10(2):43-47.
    [54]黎四芳,石称华,林海青.聚乙烯吡咯烷酮的制备研究[J].化学世界.1999,(4):201-204.
    [55]征茂平,金燕苹,顾明元.Sol-Gel法制备TiO_2/PVP纳米复合材料薄膜及性能研究[J].功能材料.2000,31(4):431-433.
    [56]刘梅堂,韦园红.高分子PVP吸附对胶体Zeta电位的影响[J].中国粉体技术.2001,7(4):1-4
    [57]P.Xinghua,L.Weigen,D.Aili.ed al.Fabrication of organic PVP doping-based Ba_(0.5)Sr_(0.5)TiO_3thick films on silicon substrates for MEMS applications[J].Materials Research Bulletin.2001,36(7):1471-1478.
    [58]W.Zheyao,L.Jianshe,R.Tianling et al.Fabrication of organic PVP doping-based Ba_(0.5)Sr_(0.5)TiO_3thick films on silicon substrates for MEMS applications[J].Sensors and Actuators.2005,117(2):293-300.
    [59]M.ALEXE,C.HARNAGEA,D.HESSE.Non-Conventional Micro-and Nanopatteming Techniques for Electroceramics[J].Electroceramics.2004,12(1-2):69-88.
    [60]L.J.Sinnamon,R.M.Bowman,J.M.Gregga.Investigation of dead-layer thickness in SrRuO_3/Ba_(0.5)Sr_(0.5)TiO_3/Au thin-film capacitors[J].Applied physics letters.2001,78(12):1724-1726.
    [61]Amanuma.Semiconductor device having capacitive element structure ani multilevel interconnection structure and method of fabricating the same[P].US:6603203B2.2003,8,5.
    [62]Cheol Seong Hwang,Byoung Tack Lee.Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and Ba,Sr.TiO_3 thin films[J].Journal of Applied Physics.1999,85(1):287-295.
    [63]Younan Xia,George M.Whitesides.Soft lithography[J].Annu.Rev.Mater.Sci.1998,37(5):84-153.
    [64]郑可炉,褚家如等.PZT铁电薄膜湿法刻蚀技术研究[J].压电与声光.2004,27(2):209-212.
    [65]赵宏锦,刘建设,任天令等.硅基薄膜的制备与刻蚀工艺研究[J].压电与声光.2001,23(4):290-292.
    [66]TAE-HO Park,KI-HO Yang.Electrical properties of ferroelectric SBT thin filmsprepared using photosensitive sol-gel solution[J].Materials Science.2003,38(6):1295-1300.
    [67]Hyeong-Ho Park,Sook Yoon,et.Electrical properties of PZT thin films by photochemical deposition[J].Thin Solid Films.2004,447-448(30):669-673.
    [68]Gaoyang Zhao,Noboru Tohge.Preparation of Photosensitive Gel Film And Fine Pattering of Amorphous Al_2O_3-SiO_2 Thin Films[J].Materials Research Bulletin.1998,33(1):21-33.
    [69]N.Tohge,G.Zhao,F.Chiba.Potosensitive gel films prepared by the chemical modification and their application to surface-relief gratings[J].Thin Solid Films.1999,351(1-2):85-90.
    [70]M.Alexe,C.Harnagea.100-nm lateral size ferroelectric memory cells fabricated by electron-beam direct writing[J].Appl.Phys.A.2000,70(3):247-251.
    [71]S.Marson,R.A.Dorey.Direct patterning of photosensitive chemical solution deposition PZT layers[J].European Ceramic Society.2004,24(6):1925-1928.
    [72]张卫华,赵高扬.钇稳定氧化锆薄膜的制备及其微细加工[J].无机材料学报.2004,3,19(2):424-428.
    [73]Z.Weihua,Z.gaoyang,et al.Array of PZT Films Preparation by Sol-gel Method[J].Transactions of the Materials Research Dociety of Japan.2004,29(4):1369-1372.
    [74]G.Y.Zhao,W.H.Zhang,Z.H.Du.Preparation of Pb_(0.98)La_(0.02)(Zr_(0.65)Ti_(0.35))O_3 films and their fine patterning[J].MRS.Bull.2004,39:449-456.
    [75]S.Marsona,R.A.Doreya,et al.Direct patterning of photosensitive chemical solution deposition PZT layers[J].Journal of the European Ceramic Society.2004,(24):1925-1928.
    [76]T.Noboru,T.Yasuo.Direct fine-patterning of PZT thin films using photosensitive gel films derived from chemically modified metal-alkoxides[J].J.Mater.Sci.1999,10:273-277.
    [77]Y.NAKAO,T.NAKAMURA,et al.Micro-Patterning of PbZr_xTi_(1-x)O_3 Thin films Prepared by Photo Sensitive Sol-gel Solution[J].Jpn.J.Appl.Phys.1993,(32):4141-4143.
    [78]惠春,陈寿田,徐爱兰.BSTO电光材料及其制备[J].压电与声光.1999,21(6):465-470.
    [79]金承钰,丁永平,孟中岩.Sol-Gel法制备Ba_xSr_(1-x)TiO_3铁电薄膜化学机制的讨论[J].无机材料学报.2000,15(4):287-291.
    [80]许煜寰等编:铁电与压电材料[M].科学出版社,北京,1978.
    [81]南开大学物理系译,电磁学[M].科学出版社,北京,1979
    [82]Sengupta Louise C.Ceramic ferroelectric material[P]US-5312790 1994 5.
    [83]E.Fatuzzo,W.J.Merz,Ferroelectricity[M].North-Holland,Amsterdam,1967.
    [84]张卫华,赵高扬,李莺等.钛酸锶钡薄膜微细图形的制备[J].半导体学报.2006,27(9):1590-1594.
    [85]Shaobo Liu,Meidong Liu,YiKe Zeng,et al.Preparation and characterization of Ba_(1-x)Sr_xTiO_3 thin films for uncooled infrared focal plane arrays[J].Materials Science and Engineering.2002,22(1):73-77.
    [86]孙晓峰,姜斌,蒋书文等.钛酸锶钡(BST)薄膜晶化过程研究[J].材料导报.2004,18(10):82-84.
    [87]郭杰,普朝光,杨明珠等.退火温度对铁电薄膜钛酸锶钡的影响[J].红外技术.2003,25(4):88-91.
    [88]傅剑,李承恩,赵梅瑜等.低温烧结PZT压电陶瓷研究进展[J].材料导报.2000.14(1):38-40.
    [89]郭杰,普朝光,杨明珠.退火温度对铁电薄膜钛酸锶钡的影响[J].红外技术.2003,25(7):88-91.
    [90]程建功,孟祥建,唐军.溶胶-凝胶法制备的Ba_(0.8)Sr_(0.2)TiO_3薄膜的结构及铁电性质研究[J].物理学报.2000,49(5):1006-1009.
    [91]程建功,孟祥建,唐军,郭少令,褚君浩.溶胶-凝胶法制备的Ba_(0.8)Sr_(0.2)TiO_3薄膜的结构及铁电性质研究[J].物理学报.2000,49(5):1006-1009.
    [92]李健康,姚熹.一种新的铁电薄膜快速热处理工艺的研究[J].红外与毫米波学报.2004,23(4):91-95.
    [93]谢志鹏,桂治轮,黄勇,李龙土.微波快速烧结对弛豫铁电陶瓷显微结构与性能的改善[J].中国科学.1999,2(2):73-76.
    [94]常爱民,陶明德.高功率微波在先进陶瓷处理中的应用[J].电子元件与材料.1997,16(4):46-50.
    [95]杨文,常爱民等.晶粒尺寸对Ba_(0.8)Sr_(0.2)TiO_3陶瓷介电铁电特性的影响[J].硅酸盐学报.2002,30(3):390-392,397.
    [96]章天金,李东,徐超,黄卫华.BST薄膜的Sol-Gel法制备及其电学性能的研究[J].压电与声光.2002,24(2):145-148.
    [97]杨文,常爱民,庄建文等.Ba_(0.65)Sr_(0.35)TiO_3陶瓷材料的制备及介电特性研究[J].无机材料学报.2004,12(1):69-88.
    [98]杨忠波,常爱民,赵青.微波烧结钛酸锶钡陶瓷材料的介电性能[J].电子元件与材料.2006,25(6):16-18.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700