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MEMS微结构力学性能的尺度效应研究
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摘要
随着科学技术的发展,微结构得到了广泛的应用。随之而来的微结构的设计和制造得到了大量的关注。越来越多的实验表明:当材料的本征长度为微米量级时,金属材料的力学性能呈现出很强的尺寸效应。经典的连续介质理论已经无法解释这些现象。因此,对微尺度下材料的力学性能研究将会对MEMS的发展带来巨大的影响。
     经典弹性理论是建立在材料的均匀、连续等假设之上的,忽略了材料内部微结构对材料力学性能的影响。本文基于偶应力理论,在经典弹性理论基础上,引入偶应力和转动梯度,重新建立MEMS微结构的力学模型,推导其平衡方程、边界条件,并建立了在连续介质理论框架下基于偶应力理论的新的本构模型,和利用这个模型分析了细铜丝扭转和微薄板弯曲以及平板式电容加速度计的尺度效应行为。
     应用高阶应变梯度理论分析微结构中孔边应力集中问题。在经典弹性理论基础上,引入高阶应力和其本构关系,推导出含有应变梯度效应的孔边应力集中问题的力学模型,并通过半逆解法,得出应力和高阶应力所对应的应力函数,从而获得其应力场,分析应力集中的尺度效应行为。
     本文的结果,为MEMS微结构的设计和制造提供良好的参考价值。
There are extensive applications of micro-structures, along with the development of science and technology. Meantime, people focus their attentions on the design and manufacturing of micro-structures. A number of experiments are demonstrated that the mechanical properties of metal materials have intense size effects, when the length scale parameters of materials are at the level of micron dimension. The phenomenon can't explain by the traditional continuous medium theory. So, the research on mechanical properties of materials will accelerate the development of MEMS.
     The traditional elastic theory, based on the hypothesis of material's continuity and uniformity, neglect the influence of inner micro-structure of the material. In this paper, the couple stress and rotation gradient are introduced, the mechanical model of micro-structure in MEMS is rebuild, the equilibrium equation and boundary condition are derived, the new constitutive relation based on the couple stress theory and elasticity theory is given. The size effect behaviors of thin brass-wire torsion, ultra-thin plate bending and plate-capacitive accelerometer are analyzed.
     Using the high-order strain gradient theory, the stress concentration around a hole has been analyzed. The high-order stress and its constitutive relations are introduced, the stress fields of the stress and high-order stress are obtained. The size effect behavior of the stress concentration problem is investigated.
     The results of this paper can provide a favorable referenced value for the design and manufacturing of micro-structure in MEMS.
引文
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