用户名: 密码: 验证码:
散斑干涉计量关键问题研究及其应用
详细信息    本馆镜像全文|  推荐本文 |  |   获取CNKI官网全文
摘要
电子散斑干涉技术(Electronic Speckle Pattern Interferometry,简称ESPI)是一种对光学粗糙表面进行非接触全场测量的技术由于具有进行全场非接触高精度和高灵敏度等特点,被广泛应用于粗糙表面的位移和变形测量,以及无损检测和振动测量方面该方法是以散斑干涉条纹图为主要研究对象,并通过对干涉条纹图的处理获取相位图并测量所需要的物理量;快速准确地提取相位,对物体的位移应变振动等测量具有重要意义主要工作如下:
     1.本文首先对基于时间相移的散斑干涉技术进行了详细和深入的讨论为了在动态和振动状态下提高相位图的质量,提出了将直接相关法和加窗傅立叶变换滤波法分别与五图四步相移法结合,产生了两种新的相位提取算法
     2.由于加窗傅立叶变换滤波的阈值处理采用固定阈值,这就会使滤波后的图像产生振铃,即伪Gibbs现象本文提出了自适应阈值法,使阈值能根据图像本身信息进行调整,克服了固定阈值的缺点,提高了相位图滤波的效果
     3.鉴于基于时间相移的相位提取算法要在不同时刻采集多幅散斑图,容易受到环境的影响,而且在测量效率方面也存在不足;而基于空间相移方法的光路虽然能在同一时刻采集多幅散斑图,可以提高测量效率,但是其光路过于复杂,实际应用难度很大为此本文提出了基于空间载波相移的散斑干涉技术——马赫-曾德尔型电子剪切散斑干涉系统基于马赫-曾德尔干涉系统的剪切散斑干涉由于其几何结构的原因其视场角很小,为了扩大其视场角,提出了一个包含4f系统的大视场角的干涉系统,并用来进行缺陷的无损检测该系统包含:CCD相机半导体激光器马赫-曾德尔干涉系统和4f系统等四部分该系统中相位图分别由改进的sinusoidal-fitting方法和傅立叶变换方法得到,并用于含有空间载波条纹的干涉中该干涉系统可以分别控制剪切量和空间载波频率在该光学系统中,成像透镜放在马赫-曾德尔干涉系统的前面,所以视场角不再受马赫-曾德尔干涉系统的限制,而只取决于成像镜头的焦距和数字相机中传感器的尺寸,突破了传统马赫-曾德尔型电子剪切散斑干涉系统视场角最大为19°的限制,实现了大视场角测量
     4.由于马赫-曾德尔干涉光路仅能有效利用一半光能,对光能利用率低,在应用于光不敏感材料时,对光能要求较高,该方法有一定局限性为了提高光能利用率,本文提出了一种新的电子剪切散斑干涉系统该光路能对全部光能进行利用,从理论上解决了利用率问题,对光能利用率的提高有很大改进
     5.随着轮胎和复合材料的快速发展,对无损检测技术提出了新的要求由于电子散斑干涉测量技术具有实时显示灵敏度高全场测量等优点,该技术在无损检测中得到了广泛应用本文根据基于空间载波相移的电子剪切散斑干涉系统,搭建了电子剪切散斑干涉无损检测装置并用VC++6.0可视化编程开发软件编制集图像采集与图像处理相位图实时显示于一体的电子散斑无损检测应用软件并采用真空加载和热加载,利用本文研究的电子剪切散斑无损检测技术,对轮胎和复合材料进行了无损检测的验证性实验研究,获取了轮胎和复合材料的缺陷图片结果显示,该方法能够快速准确的评估材料内部孔隙脱层等结构质量该系统可脱离防震台检测,切实可行
Electronic Speckle Pattern Interferometry is an optical, non-contact and full-fieldmeasurement technology for.rough surface. Because of the full-field, non-contact, highaccuracy and high sensitivity measurement characteristics, it is widely used in rough surfacedisplacement and deformation measurement, non-destructive testing and vibrationmeasurement. The method is based on speckle interference fringe pattern shows the mainobject of study to obtain the phase map, and by processing the interference fringe pattern andmeasure the physical quantity. It is significant to extract the phase of the displacement of theobject, strain, vibration and other measurements quickly and accurately. The main works areas follows:
     1. There is a detailed and in-depth discussion for the time phase shift speckleinterferometry technology firstly in this article. In order to improve the quality of the phasemap in the dynamic and vibration state, produced two new phase extraction algorithms basedon integrating direct-correlation algorithm and the Windowed Fourier transform filtering methodwith5interferogram four steps phase shifting method, respectively.
     2. Since the Windowed Fourier transform filtering threshold value process uses a fixedthreshold value, which causes the filtered image to generate a ringing, pseudo Gibbsphenomenon. In the proposed adaptive threshold method, the threshold value can be adjustedaccording to the image itself, overcomes the disadvantages of a fixed threshold value, andimproves the filtering effect of the phase diagram.
     3. With multiple speckle patterns to be collected at different times based on the phase ofthe time phase shift extraction algorithm, it is easily affected by the environment, and thereare also disadvantages in measurement efficiency; Although the phase shift method based onspatial light path can be collected at the same time multiple speckle patterns can improvemeasurement efficiency, but its light path is too complex, the actual application is verydifficult. In this paper, electronic shearing speckle interferometer system.based on spatialcarrier phase shift speckle interferometry and Mach–Zehnder is proposed. Shearographyinterferometer based on Mach-Zehnder interferometer system has a very small angle of view because the field geometry. In order to expand the angle of view, interference system with alarge angle of view based on4f system is proposed and used for non-destructive detection ofdefects. The system comprises a CCD camera, a semiconductor laser, Mach-Zehnderinterferometer and4f system. Phase maps are obtained by the improved sinusoidal-fittingmethod and Fourier transform method, respectively, and is used to contain the spatial carrierfringe interference. The interferometer system can control the amount of shear and the spatialcarrier frequency. In this optical system, the imaging lens is placed in front of the Mach-Zehnder interferometer system. the angle of view may no longer be restricted by the Mach-Zehnder interferometer system, only depends on the size of the sensor and the focal length ofthe imaging lens of digital camera, breaking the traditional Mach-Zehnder electronicshearing speckle interferometry system the angle of view the maximum limit of19°, toachieve a large field angle measurement.
     4. Mach-Zehnder interferometer optical path only use half of the light energy, lightenergy utilization rate is low, when applied to the light-sensitive material, high lightrequirements, the method has some limitations. In order to improve energy efficiency, thispaper proposes a new electronic shearing speckle pattern interferometry system. The opticalpath can take advantage of all the light energy, utilization problem is solved theoreticallyimproving light energy utilization efficiency has improved significantly.
     5. With the rapid development of the tire and composite materials, non-destructivetesting techniques proposed new requirements. Electronic speckle pattern interferometry has areal-time, high sensitivity, audience measurement and other advantage, the technology hasbeen widely used in non-destructive testing. Based on electronic shearing speckle patterninterferometry system, based on spatial carrier phase shift, electronic shearing speckle patterninterferometry is builded for Nondestructive Testing. With VC++6.0visual programmingdevelopment software to prepare a set of image acquisition and image processing, phase mapis displayed in real time in one electronic speckle non-destructive testing applications. Andthe use of vacuum load and thermal load, this article study of electronic Shearography ofnon-destructive detection technology, tire and composites NDT validation experiments,acquired defect pictures of tires and composites. The results show that this method can fastand accurate assess the material within the pores, delamination and structural quality. The system can be out of the shock station detects and practical.
引文
[1] Sirohi R.S. Speckle metrology [M]. Marcel: Dekker,1993:95-100
    [2] Rastogi P.K. Optical measurement techniques and application [M]. London: ArtechHouse,1997:102-126
    [3]秦玉文,戴嘉彬,陈金龙.电子散斑方法的进展[J].实验力学,1996,11(4):410-416
    [4]于光,王树国,于俊华.数字散斑干涉技术及应用[J].激光技术,2002,26(3):237-240
    [5] Rastogi P.K. Digital speckle pattern interferometry and related techniques [M]. Newyork:John Wiley&Sons Ltd,2001:50-56
    [6]戴蓉.激光技术在无损检测领域的应用与发展[J].激光与光电子学进展,2000,414(6):1-4
    [7] Ennos A.E. Visual Observation of Surface Vibration Nodal Patterns [J]. Nature,1966,222(5190):263-265
    [8] Matham M.V., Sujatha N. Digital speckle pattern interferometry for deformation analysisof inner surfaces of cylindrical specimens [J]. Applied Optics,2004,43(12):2400-2408
    [9] Leendertz J.A. Interferometric displacement measurement on scattering surfaces utilizingspeckle effect [J]. Journal of Physics E: Scientific Instruments,1970,3(3):312-316
    [10]Leendertz J.A., Butters J.N. An image-shearing speckle-pattern interferometer formeasuring bending moments [J]. Journal of Physics E: Scientific Instruments,1973,6(11):1107-1110
    [11]方强,陈家璧.全息散斑计量学[M].北京:科学出版社,1995:110-114
    [12]Groh G. Engineering uses of holography [M]. London: Cambridge University Press,1970:12-17
    [13]Butters J.N. Holography and video techniques applied to engineering measurements [J].Journal Measurement and Control,1971,4(2):349-354
    [14]Macovski A. Time-lapse interferometry and conturing using television systems [J].Applied Optics,1971,10(3):2722-2727
    [15]Peterson H.M. Holographic vibration measurement using a TV speckle interferometerwith silicon target vidicon [J]. Optics Communications,1974(4),12:421-426
    [16]Lokberg O.J., Hogmoen K. Vibration phase mapping using electronic speckle patterninterferometry [J]. Applied Optics,1976,15(11):2701-2704
    [17]Kemper B., Dirksen D., Avenhaus W., et al. Endoscopic double-pulseelectronic-speckle-pattern interferometer for technical and medical intracavity inspection[J]. Applied Optics,2000,39(22):3899-3905
    [18]Yamaguchi I. A laser-speckle strain gange [J]. Journal of Physics E: ScientificInstruments,1981,14(11):1270-1273
    [19]Peter W.H., Ranson W.F. Digital imaging technique in experimental stress analysis [J].Optical Engineering,1982,21(3):427-431
    [20]Hung Y.Y., Liang C.Y. Image-shearing camera for direct measurement of surface strains[J]. Applied Optics,1979,18(7):1046-1051
    [21] Davila A., Ruiz P.D., Kaufmann G.H., et al. Measurement of sub-surface delaminationsin carbon fibre composites using high-speed phase-shifted speckle interferometry andtemporalphase unwrapping [J]. Optics and Lasers in Engineering,2003,40(5-6):447–458
    [22]Nakadate S., Yatagai T., saito H. Electronic speckle pattern interferometry using digitalimage processing technique [J]. Applied Optics,1980,19(11):1879-1883
    [23]Creath K. Digital speckle pattern interferometry (DSPI) using a100X100imaging array
    [C]. Proc. of SPIE,1984,501:292-298
    [24]伍小平,何世平,李志超.空间散斑的运动规律[J].物理学报,1980,29(9):51-56
    [25]张熹.新的剪切散斑干涉法及其在检测残余应力中的应用[J].舰船科学技术,1992,3:27-32
    [26]Gulker G., Hinsch K. Electronic speckle pattern interferometry system for in-sitedeformation monitoring on buildings [J]. Optical Engineering,1990,29(7):816-820
    [27]邹广平,芦颉,王微微.电子剪切散斑技术在木材无损检测中的应用[J].哈尔滨工程大学学报,2009,30(4):356-361
    [28]Pedrini G., Zou Y.L., Tiziani H.J. Quantitative evaluation of digital shearing interferogramusing the spatial carrier method [J]. Applied Optics,1996,5:313-321
    [29]Crane R. Interference phase measurement [J]. Applied Optics,1969,8(3):538-542
    [30]Dandliker R. Heterodyne holographic interferometry [M]. North-Holland, Amsterdam,Progress in Optics,1980:100-112
    [31]Massie N.A. Real-time digital heterodyne interferometry: a system [J]. Applied Optics,1980,19(1):154-160
    [32]罗印龙. PZT相移系统及其标定方法[D].昆明:昆明理工大学,2004
    [33]Robinson D.W. Automatic fringe analysis with a computer image-processing fringepattern analysis [J]. Applied Optics,1983,22(14):2169-2176
    [34]Takeda M., Ina H., Kobayashi S. Fourier-transform method of fringe-pattern analysis forcomputer-based topography and interferometry [J]. Journal of the Optical Society ofAmerica A-optical physics,1982,72(1):156-160
    [35]金观昌,唐寿鸿,同步相位算法及其应用于自动条纹图分析[J].应用激光,1991,10(2):63-66
    [36]Su X., Chen W. Fourier transform profilometry: a review [J]. Optics and Lasers inEngineering,2001,35(5):263-284
    [37]Roddier C., Roddier F. Interferogram analysis using Fourier transform techniques [J].Applied Optics,1987,26(9):1668-1673
    [38]Bone D. J., Bachor H.-A., Sandeman R.J. Fringe-pattern analysis using a2-D Fouriertransform [J]. Applied Optics,1986,25(10):1653-1660
    [39]Nugent K.A. Interferogram analysis using a accurate fully automatic algorithm [J].Applied Optics,1985,24(18):3101-3105
    [40]Baik S.-H., Park S.-K., C.-J. Kim, et al. Two-channel spatial phase shifting electronicspeckle pattern interferometer [J]. Optics Communications,2001,192(3-6):205-211.
    [41]Tay C.J., Quan C., Chen L., et al. Phase extraction from electronic speckle patterns bystatistical analysis [J]. Optics Communications,2004,236(4-6):259-269
    [42]Chen X., Gramaglia M., Yeazell J.A. Phase-shift calibration algorithm for phase-shiftinginterferometry [J]. J. Opt. Soc. Am. A,2000,17(11):2061-2066
    [43]Lai G., Yatagai T. Generalized phase-shifting interferometry [J]. J. Opt. Soc. Am. A,1991,8(5):822-827
    [44]Weijers A.L., Brug H.V., Frankena H.J. Polarization phase stepping with a savart element[J]. Applied Optics,1998,37(22):5150-5155
    [45]Carre P. Installation et utilisation du comparateur photoelectrique et interferntiel dubureau international des poids et measures [J]. Metrologia,1996,2(1):13-23
    [46]Qian K., Shu F., Wu X., Determination of the best phase step of the Carre algorithm inphase shifting interferometry [J]. Measurement science and technology,2000,11(8):1220-1223
    [47]Matham M.V., Sujatha N. Digital speckle pattern interferometry for deformation analysisof inner surfaces of cylindrical specimens [J]. Applied Optics,2004,43(12):2400-2408
    [48]Moore D.T. Gradient index optics and tolerancing [D]. Rochester, University ofRochester,1973
    [49]Bruning J.H., Herriott D.R., Gallagher J.E., et al. Digital wavefront measuringinterferometer for testing surfaces and lenses [J]. Applied Optics,1974,13(11):2693-2703
    [50]Nakadate S., Saito H. Fringe scanning speckle pattern interferometry [J]. Applied Optics,1985,24(14):2172-2180
    [51]Creath K. Phase shifting speckle interferometry [J]. Applied Optics,1985,24(18):3053-3058.
    [52]陈金龙,秦玉文,计欣华.双界面材料粘接质量定量检测的相依错位散斑技术[J].复合材料学报,2001,18(1):127-129
    [53]Chau F.S., Zhou J. Direct measurement of curvature ans twist of plates using digitalshearography [J]. Optics and Lasers in Engineering,2003,39(4):431-440
    [54]王任达,邓兴峰.激光电子散斑术用于蜂窝夹层结构粘接质量检测[A].无损检测技术交流文集[C].北京:中国测试技术研究院实用测试技术编辑部,1998:52-60
    [55]吕晓旭,钟丽云,陈虹等.数字剪切散斑用于物体的三维面型测量[J].激光杂志,2002,23(1):63-65
    [56]Wyant C., Interferometric optical metrology: basic principles and new system [J]. Laserfocus,1982,3:65-71.
    [57]金观昌.相位测量技术的新进展及其应用[J].物理,1993,22(6):374-377
    [58]陈金龙,洪友仁.基于液晶体的大错位量散斑相移技术研究[J].光学学报,2004,24(9):1292-1296
    [59]邹博. InSAR干涉相位处理研究[D].长沙:国防科学技术大学,2005
    [60]李勇.相位测量轮廓术关键技术及应用研究[D].成都:四川大学,2006
    [61]孙平,李爱华,张丽等.在电子散斑干涉中利用反相位法进行三维变形测量[J].光学学报,2006,26(2):193-196
    [62]朱越.光学相位测量中余弦相位展开方法研究[D].昆明:昆明理工大学,2004
    [63]Smythe R., Moore R. Instantaneous phase measuring interferometry [J]. OpticalEngineering,1984,23(4):361-364
    [64]Kujawinska M., Wojciak J. Spatial-carrier phase-shifting technique of fringe patternanalysis [C]. Proc. Of SPIE, Industrial Applications of Holographic and SpeckleMeasuring Techniques,1991,1508:61-67
    [65]Burke J. Application and optimization of the spatial phase shifting technique in digitalspeckle interferometry [D]. Oldenburg, Germany, Carvon Ossietzky University,2000
    [66]Michael N.M., James M., Neal B., et al. Dynamic phase-shifting electronic specklepattern interferometer [C]. Proc. Of SPIE,2005,5869(1B):1-9
    [67]Saldner H.O., Molin N.E., Stetson K.A. Fourier-transform evaluation of phasedata inspatially phase-biased TV holograms [J]. Applied Optics,1996,35(2):332-336
    [68]金观昌,唐寿鸿.一种用于分析条纹图案的自动相位测量方法[J].中国激光,1991,18(6):405-408
    [69]金观昌,唐寿鸿.同步相位算法及其应用于自动条纹图分析[J].应用激光,1991,10(2):63-66
    [70]Zweig D.A., Hufnagel R.E. A Hilbert transform algorithm for fringe-pattern analysis [C].Proc. Of SPIE,1990,1333:295-302
    [71]Arai Y., Yokozeki S. High resolution deformation measurement method using one sheetof speckle gram [C]. Proc. Of SPIE,2006,6392(A):1-10
    [72]Larkin K.G., Bone D.J., Oldfield M.A. Natural demodulation of two dimensional fringepatterns. I. general background of the spiral quadrature transform [J]. Journal of theOptical Society of America A-optical physics,2001,18(8):1862-1870
    [73]Petitgrand S., Alain B., Guirardel M. Application of the vortex transform to microscopicinterferometry [C]. Proc. Of SPIE,2004,5458:9-15
    [74]Y. Arai and S. Yokozeki. Development of fringe analysis method for image in ESPI usingsingle sheet of specklegram [C]. Proc. Of SPIE,2005,5880:1-7
    [75]钱克矛,续伯钦,伍小平.光学干涉计量中的位相测量方法[J].实验力学,2001,16(3):239-249
    [76]Kerr D., Mendoza S.F., Tyrer J.R. Extraction of phase data from electronic specklepattern interferometric fringes using a single-phase-step method: novel approach [J].Journal of the Optical Society of America A-optical physics,1990,7(5):820-826
    [77]Yu Q.F., Fu S.H., Liu X.L., et al. Single-phase-step method with contoured correlationfringe patterns for ESPI [J]. Optics Express,2004,12(20):4980-4985
    [78]Dainty J.C. Laser speckle and related phenomena [M]. New York: Springer-Verlag,1975.9-10
    [79]Goodman J.W. Speckle phenomena in optics: theory and application [M]. GreenwoodVillage: Roberts&Company Publishers,2007
    [80]Zaman M.R., Moloney C.R. A comparison of adaptive filters for edge-preservingsmoothing of speckle noise[C]. Proceedings of International Conference on Acoustic,Speech, and Signal Processing, IEEE,1993,5:77-80
    [81]李自勤,李琦,王琪.由统计特性分析激光主动成像系统图像的噪声性质[J].中国激光,2004,31(9):1081-1085
    [82]Yu Q.F., Sun X. Y., Liu X.L. Removing speckle noise and extracting the skeletons from asingle speckle fringe pattern by spin filtering with curved-surface windows [J]. OpticalEngineering,2003,42(1):68-74
    [83]Pouet B., Krishnaswamy S. Electronic speckle techniques in noisy environments [J].SPIE,1993,2003:171-178
    [84]Ochoa N.A., Santoyo F.M., Moore A.J., et al. Contrast enhancement of electronic specklepattern interferometry addition fringe [J]. Applied Optics,1997,36(13):2783-2787
    [85]Singh T., Vikram C.S., Histogram equalization of Young’s fringes in speckle photography[J]. Proc. SPIE2002,4777:27-30
    [86]Kerr D., Santoyo F.M., Tyrer J.R. Manipulation of the Fourier components of speckleimage fringe patterns as a part of an interferometry analysis process [J]. Journal ModernOptics,1989,36(2):195-203
    [87]伏思华,于起峰.数字散斑条纹图的滤波方法[J].应用光学,2005,26(4):5-8
    [88]Henri H.A., Martin L. Combined homomorphic and local-statistics processing forrestoration of images degraded by signal-dependent [J]. Applied Optics,1984,23(6):845-850
    [89]Ding R.T., Venetsanopoolos A.N. Generalized homomorphic and adaptive order statisticfilters for the removal of impulsive and signal-dependent noise [J]. IEEE Trans. OnCircuits,1987,34(3):948-955
    [90]蒋立辉,李宁,成向阳等.基于一种新的同态滤波算法的散斑噪声压缩[J].激光与红外,2000,30(1):11-14
    [91]Pierre M., Laurent D., Xavier D., et al. Speckle reduction with edge-preserving [C]. IEEE,1997:2785-2788
    [92]Lee J.S. Digital image enhancement and noise filtering by use of local statistics [C]. IEEETrans. Pattern Analysis and Machine Intelligence,1980,2(2):165-168
    [93]Frost V.S., Stiles J.A., Shanmugan K.S., et al. A model for radar images and itsapplication to adaptive digital filtering of multiplicative noise [J]. IEEE Trans. On PatternAnalysis and Machine Intelligence,1982,4(2);157-166
    [94]Kuan D.T., Sawchuk A.A., Strand T.C., et al. Adaptive noise smoothing filter for imageswith signal-dependent noise [C]. IEEE Trans. On Pattern Analysis and MachineIntelligence,1985,7(2);165-177
    [95]Lopes A., Touzi R., Nezry E. Adaptive speckle filters and scene heterogeneity [J]. IEEETrans. Geoscience and Remote Sensing,1990,28(6):992-1000
    [96]柏延臣,王劲峰,朱彩英等.基于小波分析的图像斑点滤波及其性能比较评价[J].遥感学报,2003,7(5):393-399
    [97]Yu Q.F. Spin filtering processes and automatic extraction of fringe centerlines in digitalinterferometric patterns [J]. Applied Optics,1988,27(18):3782-3784
    [98]Kaufmann G.H. Galizzi G.E. Speckle noise reduction in TV holography fringes usingwavelet thresholding [J]. Optical Engineering,1996,35(1):9-14
    [99]Chandra S., Rajesh K., Singh S.K., et al. Application of wavelet filtering for vibrationanalysis using digital speckle pattern interferometry [J]. Optical Engineering,2002,41(1):176-180
    [100] Kumar R., Singh S.K., Shakher C. Wavelet filtering applied to time-average digitalspeckle pattern interferometry fringes [J]. Optical and Laser Technology,2001,33(8):567-571
    [101] Kaufmann G.H., Davila A., Kerr D. Speckle noise reduction in TV holography [C].Proc. Of SPIE,1996,2730:96-100
    [102] Safa F., Fiouzar G. Speckle removal based on mathematical morphology [J]. SignalProcessing,1989,16(4):320-333
    [103] Zhao C.H., Sun S.H., Qiao J.L. A generalized morphological filter based on adaptiveweighted average [J]. Chinese Journal of Electronics,1997,6(3):76-81
    [104]蒋立辉,王骐,王春晖等. Speckle noise suppressing based on a parallelcombination weighted average multistage morphological filtering algorithm基于并行组合加权均值级联形态滤波算法的散斑噪音压缩[J].光子学报,1999,28(10):923-927
    [105] Jiang L.H., Guo Y.Y. Speckle suppressing based on fuzzy generalized morphologicalfilter [C]. ICMLC2005,2005:1070-1076
    [106] Kemao Q. Windowed Fourier transform for fringe pattern analysis [J]. AppliedOptics,1979,43(13):2695-2702
    [107] Kemao Q. Two-dimensional windowed Fourier transform for fringe pattern analysis:Principles, applications and implementations [J]. Optics and Lasers in Engineering,2007,45(2):304-317
    [108] Qian K., Soon S.H., Asundi A. A simple phase unwrapping approach based onfiltering by windowed Fourier transform [J]. Optics&Laser Technology,2005,37(6):458-462
    [109] Cordero R.R., Lira I. Uncertainty analysis of displacements measurement byphase-shifting moire interferometry [J]. Optics Communications,2004,237(1-3):25-36
    [110] Bovik A.C. On detecting edges in speckle imagery [J]. IEEE Transactions onAcoustics, Speech and Signal Processing,1988,36(10):1618-1627
    [111]戴蓉,激光技术在无损检测领域的应用与发展[J].激光与光电子学进展,2000,414(6):1-4
    [112]丁子明.无损检测技术的应用与发展动向[J].计测,1991,3:52-56
    [113]吴天茂.无损检测技术及其应用[J].东方电机,2002,30(3):267-270
    [114]曾祥照.无损检测文化概论[J].无损探伤,2002,2:34-37
    [115]孔凡庚.从第14届无损检测会议看射线无损检测技术的应用与发展[J].无损检测,1997,19(11):328-330
    [116]耿荣生.新千年的无损检测技术—从罗马会议看无损检测技术的发展方向[J].无损检测,2001,23(1):2-5
    [117]徐惠娟,黄启忠.工业CT在C/C复合材料无损检测中的应用[J].新型碳材料,1998,13(2):25-28
    [118]许凤旌,陈积懋.声发射技术在复合材料发展中的应用[J].机械工程材料,1997,21(4):30-34
    [119]周在桤.微波检测[M].北京:国防工业出版社,1989:120-125
    [120]张亚琴,郁标.红外成像无损检测技术的基本原理及其应用范围[J].上海地质,2002,84(4):47-52
    [121]余拱信.激光全息无损检测技术的应用现状及发展趋势[J].航空科学技术,1998,3:22-23
    [122]安宝祥.汽车制造无损检测应用技术[M].北京:北京理工大学出版社,1998:123-126
    [123]陈积懋.复合材料无损评定技术[J].无损检测,1991,13(3):74-77
    [124]赵渠森.复合材料[M].北京:国防工业出版社,1979:145-147
    [125]陈金根.复合材料制品的超声检测[J].无损探伤,1995,6:1-8
    [126]雷宁,高凌.复合材料无损检测技术的新发展[J].固体火箭技术,1994,2:74-78
    [127]耳东.复合材料无损检验的新进展[J].航空制造工程,1994,5:33-35
    [128] Born M. Wolf E. Principle of optics (sixth edition)[M]. London: Pergamon Press,1988:230-235
    [129] Gabor D. A new microscopic principle [J]. Nature,1948,161:777-785
    [130] Gabor D. Holography,1948-1970[C], Proc. IEEE,1972,60:655-668
    [131] Burch J.M., Ennos A.E., Wilton R.J. Dual and multiple-beam interferometry by wavefront reconstruction [J]. Nature,1966,209:1015-1016
    [132] Burch J.M., Tokarski J.M.J. Production of multiple beam fringes from photographicscatterers [J]. Journal of Modern Optics,1968,15(2):101-111
    [133] Archbold E., Burch J.M., Ennos A.E. Recording of in-plane surface displacement bydouble exposure speckle photography [J]. Optical ACTA,1970,17(12):883-898
    [134] Butters J.N., Leendertz J.A. Speckle pattern and holographic techniques inengineering metrology [J]. Optics and Laser Technology,1971,3(26):26-30
    [135] Butters J.N., Leendertz J.A. Holographic and video techniques applied to engineeringmeasurement [J]. Journal of Measurement and control,1971,4:349-354
    [136] Gdoutos E.E. Recent advances in experimental mechanics [M], Netherlands: KluwerAcademic Publishers,2002.397-408
    [137] Hung Y.Y., Taylor C.E. Speckle shearing interferometric camera: a tool formeasurement of derivatives of surface displacement [C]. Proc. Of SPIE,1973,41:169-175
    [138] Wykes C. De-correlation effects in speckle-pattern interferometry [J]. Optical ACTA,1977,24:517-532
    [139] Fujii H., Asakura T. Effect of surface roughness on the statistical distribution ofimage speckle intensity [J]. Optics Communications,1974,11(1):35-38
    [140] Fujii H., Asakura T., Shindo Y. Measurements of surface roughness properties bymeans of laser speckle techniques [J]. Optics Communications,1976,16(1):68-72
    [141] Jones R., Wykes G. The comparison of complex object geometries using acombination of electronic speckle pattern interferometric difference contouring andholographic illumination elements [J]. Optical ACTA,1978,25(6):449-472
    [142] Jones R., Wykes G. General parameters for the design and optimization of electronicspeckle pattern interferometry [J]. Optical ACTA,1981,28(7):949-972
    [143] Newman, John W. Non-destructive testing by laser scanning [P]. US Patent:4824250.1988
    [144] Seidensticker J.R., Mayo M.J., Zhang Z.Y., et al. ESPI non-destructive testing ofGRP composite materials containing impact damage [J]. Composites Part A: AppliedScience and Manufacturing,1998,29(7):721-729
    [145] Xue Y.Q., Kennedy D., Mihaylova E. Electronic speckle pattern shearinginterferometry for nondestructive testing of thermal sprayed alloy coatings [C]. Proc. ofSPIE.2005,5824:241-249
    [146] Kaufmann G.H. Nondestructive testing with thermal waves using phase-shiftingtemporal speckle pattern interferometry [J]. Optical Engineering,2003,42(7):2010-2014
    [147] Hatta H., Aly Hasan M.S., Hatsukade, et al. Damage detection of C/C compositesusing EPSI and SQUID techniques [J]. Composites Science and Technology,2005,65(7-8):1098-1106
    [148] Ambu R., Aymerich F., Ginesu, et al. Assessment of NDT interferometric techniquesfor impact damage detection in composite laminates [J]. Composite Science andTechnology,2006,66(2):199-205
    [149] Kang K., Choi M., Kim K., et al. Inspection of impact damage in honeycombcomposite plate by ESPI, ultrasonic testing, and thermography [C].12th A-PCNDT2006-Asia-Pacific Conference on NDT, New Zealand,2006
    [150] Yang L.X. Recent developments in digital shearography for nondestructive testing [J].Material Evaluation,2006,64(7):703-709
    [151] Anastasi R.F., Serabian S.M., Shuford R.J., et al. Nondestructive detection ofsimulated delamination in composite laminates by laser-speckle shearography [J].Experimental Techniques. Tech.,1987,11(6):28-31
    [152] Shang H.M., Toh S.L., Chau F.S., et al. Location and sizing disbands inglassfiber-reinforced plastic plates using shearography [J]. J. Eng. Mat. Tech.,1991,11(113):99-103
    [153] Smith R.A. Advanced NDT of composites in the United Kingdom [J]. Materialsevaluation,2007,65(7):697-710
    [154]伍小平.实验力学中现代光学方法的发展与应用前景[J].机械强度,1995,17(2):20-26
    [155]秦玉文,王金起,张福根.电子错位散斑研究[J].力学学报,1990,22(6):725-731
    [156]秦玉文. ESS电子剪切散斑系统通过鉴定[J].实验力学,1990,5(1):103
    [157]戴嘉彬,王金起,秦玉文.电子剪切散斑图像处理的相位技术[J].实验力学,1992,7(2):153-158
    [158]戴嘉彬,秦玉文,王金起.电子错位散斑的实时时间差技术[J].实验力学,1993,8(3):214-318
    [159]金观昌.电子错位散斑干涉术用于无损检测的探讨[J].实验力学,1992,7(2):181-187
    [160]李喜德,刘兴福,陈志.焊缝缺陷的电子散斑现场检测技术研究[J].光子学报,1998,27(10):911-918
    [161] Liu W., Tan Y., Shang H.M. Single mode optical fiber electronic speckle patterninterferometry [J]. Optics and Lasers in Engineering.1996,25(2-3):103-109
    [162] Wang W.C., Day C.H., Hwang C.H., et al. Nondestructive evaluation of compositematerials by ESPI [J]. Research in Nondestructive Evaluation,1998,10(1):1-15.
    [163] Wang W.C., Su C.W., Liu P.W. Full-field non-destructive analysis of compositeplates [J]. Composites Part A: Applied Science and Manufacturing,2008,39(8):1302-1310
    [164]陈金龙,孙晨光,秦玉文等.复合材料(结构)粘结质量检测的错位散斑技术[J].宇航学报,2004,25(3):323-326,342
    [165]崔永忠,张坚.复合材料散斑干涉检测中的音频激振加载系统研究[J].空军工程大学学报,2006,7(3):20-22
    [166]张坚,耿荣生.复合材料的现场电子剪切散斑检测技术研究[J].无损检测,2007,29(7):378-381
    [167]刘宝会.多功能数字散斑干涉无损检测技术及应用研究[D].天津:天津大学博士学位论文,2006
    [168]杨桂娟,梅妍,白亚乡.全息术及其应用[J].应用光学,2006,27(2):96-100
    [169] Li X.D., Liu X.F., Wang K. Quantitative detection of the defects in thin-walledpressure vessels with holography and shearing speckle interferometry [J]. Journal ofNondestructive evaluation,2002,21(3):85-94
    [170]张晓光,林家骏.实时射线检测焊缝缺陷的模糊神经网络识别方法[J].自动化仪表,2003,24(2):21-24
    [171] Masnata A., Sunseri M. Neural network classification of flaws detected by ultrasonicmeans [J]. NDT&E International,1996,29(2):87-93
    [172] Iftekharuddin K.M. Orthogonal wavelets in nonlinear speckle reduction for improvedtarget recognition [J]. Optical Engineering,2000,39(5):1211-1217
    [173] Sun J.G. Method for determining defect depth using thermal imaging [P]. U.S. PatentNo.6542849,2003
    [174] Zhang X.G., Xu J.J., Li Y. The research of defect recognition for radiographic weldimage based on fuzzy neural network [J]. Proc. of the5th World Congress on Intelligentcontrol and Automation (China),2004:2661-2665
    [175] Shafeek H.I., Gadelmawla E.S., Abdel-Shafy A.A., et al. Automatic inspection of gaspipeline welding defects using an expert vision system [J]. NDT&E International,2004,37(34):301-307
    [176] Kazantsev I.G., Lemahieu I., Salov G.I., et al. Statistical detection of defects inradiographic images in nondestructive testing [J]. Signal Processing,2002,82(5):791-801
    [177] Dore P., Gauthier E. Speckle interferometry diagnostic for erosion/redepositionmeasurement in tokamaks [J]. Journal of Nuclear Materials,2007,363-365(15):1414-1419
    [178] Werner J., Thomas K., Uhike M., et al. Application of neural network and knowledgebased systems for automatic identification of fault indicating fringe patterns [C]. Proc. ofSPIE,1994,2342:16-26
    [179] Maranon A., Ruiz P.D., Nurse A.D., et al. Identification of subsurface delaminationsin composite laminates [J]. Composites Science and Technology,2007,67(13):2817-2826
    [180]王恺,李喜德,刘兴福.剪切散斑干涉与有限元优化计算相结合实现缺陷参数的定量求解[J].实验力学,2003,18(3):308-312
    [181]柴东亮,王亮亮,于瀛洁.基于ESPI技术的物体缺陷自动识别技术[J].光学精密工程,2005,13(Supp.):173-178
    [182]金观昌.光学无损检测及其工业应用[J].应用激光,1990,10(1):31-32
    [183]金观昌.计算机辅助光学测量.[M].北京:清华大学出版社,1997:52-60
    [184] Waldner SP. Quantitative Strain Analysis with Image Shearing Speckle PatternInterferometry (Shearography)[D].天津: Swiss Federal Institute of Technology Zurich,2000
    [185]张伟伟,贺玲凤,顾学甫.电子剪切散斑在检测材料缺陷中的应用[J].实验力学,2006,21(6):753-757
    [186]张东升,胡瑜辉.一种用于无损检测的数字剪切散斑干涉系统[J].力学季刊,2009,30(3):405-409
    [187] Davila A., Kerr D., Kaufmann G.H. Digital processing of electronic speckle patterninterferometry addition fringes [J]. Applied Optics,1994,33(25):5964-5969
    [188] Ochoa N.A., Santoyo F.M., Lopez C.P. Multiplicative electronic speckle-patterninterferometry fringes [J]. Applied Optics,2000,39(28):5138-5141
    [189] Douglas R. Schmitt, Hunt R.W. Optimization of fringe pattern calculation with directcorrelations in speckle interferometry [J]. Applied Optics,1997,36(36):8848-8857
    [190] Picart P., Pascal J.C., Breteau J.M. Systematic errors of phase-shifting speckleinterferometry [J]. Applied Optics,2001,40(13):2107-2116
    [191] Schedin S., Gren P. Phase evaluation and speckle averaging in pulsed televisionholography [J]. Applied Optics,1997,36(17):3941-3947
    [192] Haasteren, Arjan J.P.V., Real-time displacement measurement using a multicameraphase-stepping speckle interferometer [J]. Applied Optics,1994,33(19):4137-4142
    [193] Millerd J.E., Brock N.J. Hayes. J.B. Pixelated phase-mask dynamic interferometer [J].Proceding of SPIE,2004,5531:304-314
    [194] Li C., Tang C., Yang H., Wang L., et al. Localized Fourier transform filter for noiseremoval in electronic speckle pattern interferometry wrapped phase patterns [J]. AppliedOptics,2011,50(24),4903-4911
    [195] Bhaduri B., Mohan N.K., Kothiyal M.P. Use of spatial phase shifting technique indigital speckle pattern interferometry (DSPI) and digital shearography (DS)[J]. Opticsexpress,2006,14(11):598-607

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700