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半导体功率放大激光器耦合效率的研究
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摘要
本论文通过对波长为1.3μm、InGaAsP/InP材料的半导体功率放大激光器的特殊结构的分析和研究,采取在半导体功率放大激光器相应的腔面镀膜的方法,以获得高的增益、降低阈值电流、提高激光器的光耦合效率以及光输出功率。为了提高半导体功率放大激光器中激光发生器与激光放大器的光耦合效率,我们通过在半导体功率放大激光器的激光发生器的前腔面镀制高反射膜方法,提高激光发生器端面的光输出,进而来提高它的光耦合效率,我们采用ZrO_2和MgF_2作为多层介质高反射膜,通过理论计算,半导体功率放大激光器后腔面反射率理论上可达到92.5%。最后通过实验分析加以验证,半导体功率放大激光器在镀制反射膜之后,它的整体工作功率提高了36.3-50%。
     同时,为了进一步提高半导体功率放大激光器中的激光发生器与激光放大器的耦合效率,我们采取在半导体功率放大激光器激光放大器的前腔面镀制SiO增透膜的方法来提高相应腔面的透射率,进一步提高它的光耦合效率。并采用软件进行模拟计算分析,整体透射率得到了明显改善。提高了半导体功率放大激光器的光耦合效率以及输出的光功率。
This paper introduces the stracture and fundamental principle of 1.3μrn InGaAsP/InP laser with semiconductor power amplification. In order to obtain the high gain of laser with semiconductor power amplification, reduces the threshold value electric current of laser with semiconductor power amplification, to enhances the quantum efficiency and the laser output, before the design the end surface plates the anti- reflection film, the after end plates the system high reflection membrane. Because the film with low absorption, low scatter and high threshold value, ZrO_2 and MgF_2 are selected as the materials of the film,causes the back cavity back surface index of reflectivity of laser with semiconductor power amplification is 92.5% In theory, and the power efficiency of laser with semiconductor power amplification enhances by between 36.3% to 50%.
     The properties of coatings have been analysed theoretically and experimentally throughout the deposition process of SiO antireflection films on facets of laser with semiconductor power amplification, and with a wavelength. The transmittanse of cavity faces have been increased appearently.The coupling efficiency of laser with semiconductor power amplification, output power of laser with semiconductor power amplification and operating lifetime have been improved.
引文
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