陀螺加速寿命试验研究
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摘要
对机电产品加速寿命试验研究是新时期武器装备研制的迫切需要，也是可靠性试验技术发展的趋势。本课题的研究将为加速我国武器装备研制进度和快速评定武器装备可靠性指标提供一套成熟的试验方法和应用指南。
本课题通过对加速寿命试验的需求和适用范围的分析，在充分吸收国内外先进技术的基础上，分析、总结目前加速寿命试验的具体做法，以典型机电产品(F98MI陀螺)为研究对象，提出一套实用的、适合机电产品加速寿命试验的指南，并用应用案例给予说明与验证，同时开发支持加速寿命试验分析评估计算机的相关软件，该软件的工程适用性好、使用方便、功能覆盖目前加速寿命试验所有可能遇到的方法和寿命分布，便于在工程中推广应用。
本课题的研究成果在军工行业具有较好的推广价值，未来的军事应用前景广阔。特别是对弹药、小型电子设备具有较好的指导意义。
The acceleration life test (ALT) study for electromechanical devices is the urgent need of weaponry in the new period, and also the development trends of reliability test.
The topic analysis the need and the adaptability of ALT, absorb the advanced technique, analysis and study the typical electromechanical produce (F98MI gyroscope), summarize a set of guiding method of ALT, and develop a software of ALT, which has good engineering adaptability in the ALT method and life distribution.
Above research results has big popularized value and also military application vast vistas in the future, especial which has guiding meaning for ammunition and electronic mini-plant.
本课题通过对加速寿命试验的需求和适用范围的分析，在充分吸收国内外先进技术的基础上，分析、总结目前加速寿命试验的具体做法，以典型机电产品(F98MI陀螺)为研究对象，提出一套实用的、适合机电产品加速寿命试验的指南，并用应用案例给予说明与验证，同时开发支持加速寿命试验分析评估计算机的相关软件，该软件的工程适用性好、使用方便、功能覆盖目前加速寿命试验所有可能遇到的方法和寿命分布，便于在工程中推广应用。
本课题的研究成果在军工行业具有较好的推广价值，未来的军事应用前景广阔。特别是对弹药、小型电子设备具有较好的指导意义。
The acceleration life test (ALT) study for electromechanical devices is the urgent need of weaponry in the new period, and also the development trends of reliability test.
The topic analysis the need and the adaptability of ALT, absorb the advanced technique, analysis and study the typical electromechanical produce (F98MI gyroscope), summarize a set of guiding method of ALT, and develop a software of ALT, which has good engineering adaptability in the ALT method and life distribution.
Above research results has big popularized value and also military application vast vistas in the future, especial which has guiding meaning for ammunition and electronic mini-plant.
引文
1 潘吉安．可靠性维修性可用性评估手册．北京：国防工业出版社，1995
2 戴树森．可靠性试验及统计分析．北京：国防工业出版社，1984
3 贺国芳．可靠性数据的收集与分析．北京：国防工业出版社，1995
4 刘德贵，费景高，于泳江，李广元．FORTRAN算法汇编(第一、二分册)．北京：国防工业出版社，1998
5 徐灏．疲劳强度．北京：高等教育出版社，1988
6 茆诗松，王玲玲．加速寿命试验．北京：科学出版社，2000
7 马海训，李彩霞．加速寿命试验数据分析．石家庄：河北科学技术出版社，1998
8 中国电子技术标准化研究所．可靠性试验用表(增订本)．北京：国防工业出版社，1987
9 费鹤良，王玲玲．产品寿命分析方法．北京：国防工业出版社，1988
10 王炳兴．Weibull分布的统计推断．应用概率统计．1992(R-8)：357-364
11 张志华．Weibull分布场合恒定应力加速寿命试验的最优线性无偏估计．华东师范大学学报(自然科学版)．1995(4)：9-15
12 仲崇新，威布尔分布场合下恒定应力加速寿命试验的Bayes方法．应用数学学报．1992(R-15)：373-379
13 王炳兴，王玲玲．加速寿命试验参数估计．华东师范大学学报(自然科学版)．1996(3)：27-32
14 汤银才．指数分布场合多总体带约束参数的估计与比较．数理统计与管理．1997(增刊)：101-104
15 费鹤良．两应力下恒定应力加速寿命试验的最好线性无偏估计．标准化通讯．1980(1)：27-31
16 王玲玲，许家清．威布尔分布下恒加试验中的区间估计．数理统计与应用概率．1994(R-9)：84-92
17 王炳兴．Weibull分布基于恒加速寿命试验数据的统计分析．应用概率统计．2002(R-18)：413-418
18 汤银才．加速寿命试验Bayes估计算法的改进．应用数学与计算数学学报． 1997(R-11)：37-45
19 赵培东，费鹤良．对数正态恒加试验的MLE和AMLE．上海师大学报．1997(R-26)：23-29
20 费鹤良，赵培东．对数正态分布恒加试验的近似区间估计．数理统计与管理．1997(增刊)：67-70
21 孙利民，夏爱生，周学清．双应力下恒定应力加速寿命试验的最优线性不变估计．安徽师范大学学报．2001(R-24)：116-119
22 茆诗松．指数分布场合下步进应力加速寿命试验的统计分析．应用数学学报．1985(R-8)：311-316
23 仲崇新、张志华．指数分布场合定时和定数截尾步加试验的统计分析．应用概率统计．1991(R-7)：52-60
24 费鹤良．指数模型步进应力加速寿命试验的区间估计．应用概率统计．1995(R-11)：297-304
25 张志华．指数分布场合下步进应力加速寿命试验的Bayes分析．高校应用数学学报．1997(R-12)：175-182
26 费鹤良，牛美玲．幂律-威布尔模型下简单步进应力加速寿命试验的区间估计．系统科学与数学．2000(R-20)：307-313
27 李春林，屈驳韵．对数正态分布下步加试验方法的优效性．河北师大学报(自然科学版)．1997(R-21)：132-134
28 Bai, D. S., Kim,M.S., Lee, S.H., "Optimum Simple Step-Stress Accelerated Life Tests with Censoring," IEEE Transa. on Reliability, 1989,Vol. 38, 528-532
29 Bai,D.S., Chun, Y.R., "Optimum Simple Step-Stress Accelerated Life -Tests with Competing Causes of Failure," IEEE Transa. on Reliability, 1991,Vol. 40, 622-627
30 Bai,D.S., Chung, S.W., "Optimum Design of Partially Accelerated Life TeSts for the Expo-nential Distribution under Type-Ⅰ Censoring," IEEE Transa. on Reliability, 1992, Vol. 41, 400-406
31 Bai,D.S., Kim, M. S., "Optimum Simple Step-stress Accelerated Life Tests for Weibull Dis-tributions and Type Ⅰ Censoring", Naval Research Logistics, 1993,Vol. 40, 193-210
32 Escobar, L.A.& Meeker, W.Q., "Planning Accelerated Life Tests With Two or More Experi-mental Factors", Technometrics, 1995,Vol. 37, 411-427
33 Escobar, L.A.& Meeker, W.Q., "The Asympototic Equivalence of The Fisher Information Matrices for Type Ⅰ and Type Ⅱ Censored Data from Location-Scale Families," Commun.Statist.-Theory Meth, 2001,Vol. 30, 2211-2225
34 Meeker, W.Q., "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type Ⅰ censoring", Technometrics, 1984,Vol. 26, 157-171
35 Meeker, C.A. & Meeker, W.Q., "Optimum Accelerated Life Tests with Nonconstant Scale Parameter", Technometrics, 1994,Vol. 36, 71-83
36 Meeker, W.Q., Escobar, L.A.,Statistical Method for Reliability Data, John Wiley & Sons, Inc, 1998
37 Meeker, W.Q., Nelson,W.B., "Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions", IEEE Trans. on Reliability, 1975,Vol. 24, 321-332
38 Meeker, W.Q., Escobar, L.A., "Discussion of Failure Augmenta-tion Method:An Infor-mation Maximization Approach to Categorical Response Optimization", Technometrics, 2004,Vol. 46, 15-16
39 Miller, R.,Nelson,W., "Optimum Simple Step-Stress Plans for Accelerated Life Testing" IEEE Trans. on Reliability, 1983 Vol. 32, 59-65
40 Nelson,W.,Accelerated Testing, John Wiley & Sons, Inc., 1990
41 Nelson, W., Kielpinski,T., "Theory for Accelerated Life Tests for Normal and lognormal Distributions", Technometrics, 1976, Vol. 18, 105-114
42 Nelson,W.,Meeker, W.Q., "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions", Technometrics, 1978, Vol. 20, 171-177
43 Xu, H. & Tang, Y., "Commentary: The Khamis/Higgins Model", EEEE Transactions on Reliability, 2003, Vol. 52, 4-6
44 Xu, H & and Fei, H, "Planning Two-variable Accelerated Life Tests",The 6th Proceedings of ICRMS, xi'an, China, 2004,275-277
45 John H. Mathews, kurtisD. Fink Numerical Methods using MATLAB (Third Edition), Pearson Education, Inc., Publishingas Preutice Hall, 2001
46 Nelson. W, Accelerated life testing-step-stress modeland data analyses, IEEE Trans. on Reliability, R-29,1980,103-108
47 Wayne Nelson, Accelerated Testing, John Wiley & Sons, 1990
48 Wayne Nelson, & William Q. Meeker, Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions, Technometrics, R-20, 1978. 171-177
49 Meeker, W.Q. & Nelson, W.B. Optimum Accelerated Life- Tests for the Weibull and Extreme Value Distributions, IEEE Transa. on Reliability, R-24, 1975, 321-332
50 D.S. Bai & S.W. Chung, Optimum Design of Partially Accelerated Life Tests for the Exponential Distribution under Type-Ⅰ Censoring, IEEE Transa. on Reliability, R-41, 1992, 400-406
51 Robert Miller & Wayne Nelson, Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transa. on Reliability, R-32, 1983, 59-65
52 D.S.Bai & M.S.Kim, Optimum Simple Step-Stress Accelerated Life Tests with Censoring, IEEE Trans. Reliability, R-38, 1989, 528-532
2 戴树森．可靠性试验及统计分析．北京：国防工业出版社，1984
3 贺国芳．可靠性数据的收集与分析．北京：国防工业出版社，1995
4 刘德贵，费景高，于泳江，李广元．FORTRAN算法汇编(第一、二分册)．北京：国防工业出版社，1998
5 徐灏．疲劳强度．北京：高等教育出版社，1988
6 茆诗松，王玲玲．加速寿命试验．北京：科学出版社，2000
7 马海训，李彩霞．加速寿命试验数据分析．石家庄：河北科学技术出版社，1998
8 中国电子技术标准化研究所．可靠性试验用表(增订本)．北京：国防工业出版社，1987
9 费鹤良，王玲玲．产品寿命分析方法．北京：国防工业出版社，1988
10 王炳兴．Weibull分布的统计推断．应用概率统计．1992(R-8)：357-364
11 张志华．Weibull分布场合恒定应力加速寿命试验的最优线性无偏估计．华东师范大学学报(自然科学版)．1995(4)：9-15
12 仲崇新，威布尔分布场合下恒定应力加速寿命试验的Bayes方法．应用数学学报．1992(R-15)：373-379
13 王炳兴，王玲玲．加速寿命试验参数估计．华东师范大学学报(自然科学版)．1996(3)：27-32
14 汤银才．指数分布场合多总体带约束参数的估计与比较．数理统计与管理．1997(增刊)：101-104
15 费鹤良．两应力下恒定应力加速寿命试验的最好线性无偏估计．标准化通讯．1980(1)：27-31
16 王玲玲，许家清．威布尔分布下恒加试验中的区间估计．数理统计与应用概率．1994(R-9)：84-92
17 王炳兴．Weibull分布基于恒加速寿命试验数据的统计分析．应用概率统计．2002(R-18)：413-418
18 汤银才．加速寿命试验Bayes估计算法的改进．应用数学与计算数学学报． 1997(R-11)：37-45
19 赵培东，费鹤良．对数正态恒加试验的MLE和AMLE．上海师大学报．1997(R-26)：23-29
20 费鹤良，赵培东．对数正态分布恒加试验的近似区间估计．数理统计与管理．1997(增刊)：67-70
21 孙利民，夏爱生，周学清．双应力下恒定应力加速寿命试验的最优线性不变估计．安徽师范大学学报．2001(R-24)：116-119
22 茆诗松．指数分布场合下步进应力加速寿命试验的统计分析．应用数学学报．1985(R-8)：311-316
23 仲崇新、张志华．指数分布场合定时和定数截尾步加试验的统计分析．应用概率统计．1991(R-7)：52-60
24 费鹤良．指数模型步进应力加速寿命试验的区间估计．应用概率统计．1995(R-11)：297-304
25 张志华．指数分布场合下步进应力加速寿命试验的Bayes分析．高校应用数学学报．1997(R-12)：175-182
26 费鹤良，牛美玲．幂律-威布尔模型下简单步进应力加速寿命试验的区间估计．系统科学与数学．2000(R-20)：307-313
27 李春林，屈驳韵．对数正态分布下步加试验方法的优效性．河北师大学报(自然科学版)．1997(R-21)：132-134
28 Bai, D. S., Kim,M.S., Lee, S.H., "Optimum Simple Step-Stress Accelerated Life Tests with Censoring," IEEE Transa. on Reliability, 1989,Vol. 38, 528-532
29 Bai,D.S., Chun, Y.R., "Optimum Simple Step-Stress Accelerated Life -Tests with Competing Causes of Failure," IEEE Transa. on Reliability, 1991,Vol. 40, 622-627
30 Bai,D.S., Chung, S.W., "Optimum Design of Partially Accelerated Life TeSts for the Expo-nential Distribution under Type-Ⅰ Censoring," IEEE Transa. on Reliability, 1992, Vol. 41, 400-406
31 Bai,D.S., Kim, M. S., "Optimum Simple Step-stress Accelerated Life Tests for Weibull Dis-tributions and Type Ⅰ Censoring", Naval Research Logistics, 1993,Vol. 40, 193-210
32 Escobar, L.A.& Meeker, W.Q., "Planning Accelerated Life Tests With Two or More Experi-mental Factors", Technometrics, 1995,Vol. 37, 411-427
33 Escobar, L.A.& Meeker, W.Q., "The Asympototic Equivalence of The Fisher Information Matrices for Type Ⅰ and Type Ⅱ Censored Data from Location-Scale Families," Commun.Statist.-Theory Meth, 2001,Vol. 30, 2211-2225
34 Meeker, W.Q., "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type Ⅰ censoring", Technometrics, 1984,Vol. 26, 157-171
35 Meeker, C.A. & Meeker, W.Q., "Optimum Accelerated Life Tests with Nonconstant Scale Parameter", Technometrics, 1994,Vol. 36, 71-83
36 Meeker, W.Q., Escobar, L.A.,Statistical Method for Reliability Data, John Wiley & Sons, Inc, 1998
37 Meeker, W.Q., Nelson,W.B., "Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions", IEEE Trans. on Reliability, 1975,Vol. 24, 321-332
38 Meeker, W.Q., Escobar, L.A., "Discussion of Failure Augmenta-tion Method:An Infor-mation Maximization Approach to Categorical Response Optimization", Technometrics, 2004,Vol. 46, 15-16
39 Miller, R.,Nelson,W., "Optimum Simple Step-Stress Plans for Accelerated Life Testing" IEEE Trans. on Reliability, 1983 Vol. 32, 59-65
40 Nelson,W.,Accelerated Testing, John Wiley & Sons, Inc., 1990
41 Nelson, W., Kielpinski,T., "Theory for Accelerated Life Tests for Normal and lognormal Distributions", Technometrics, 1976, Vol. 18, 105-114
42 Nelson,W.,Meeker, W.Q., "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions", Technometrics, 1978, Vol. 20, 171-177
43 Xu, H. & Tang, Y., "Commentary: The Khamis/Higgins Model", EEEE Transactions on Reliability, 2003, Vol. 52, 4-6
44 Xu, H & and Fei, H, "Planning Two-variable Accelerated Life Tests",The 6th Proceedings of ICRMS, xi'an, China, 2004,275-277
45 John H. Mathews, kurtisD. Fink Numerical Methods using MATLAB (Third Edition), Pearson Education, Inc., Publishingas Preutice Hall, 2001
46 Nelson. W, Accelerated life testing-step-stress modeland data analyses, IEEE Trans. on Reliability, R-29,1980,103-108
47 Wayne Nelson, Accelerated Testing, John Wiley & Sons, 1990
48 Wayne Nelson, & William Q. Meeker, Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions, Technometrics, R-20, 1978. 171-177
49 Meeker, W.Q. & Nelson, W.B. Optimum Accelerated Life- Tests for the Weibull and Extreme Value Distributions, IEEE Transa. on Reliability, R-24, 1975, 321-332
50 D.S. Bai & S.W. Chung, Optimum Design of Partially Accelerated Life Tests for the Exponential Distribution under Type-Ⅰ Censoring, IEEE Transa. on Reliability, R-41, 1992, 400-406
51 Robert Miller & Wayne Nelson, Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transa. on Reliability, R-32, 1983, 59-65
52 D.S.Bai & M.S.Kim, Optimum Simple Step-Stress Accelerated Life Tests with Censoring, IEEE Trans. Reliability, R-38, 1989, 528-532