“看见”底部:基于开尔文探针力显微镜的全聚合物太阳能电池无损检测
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- 英文论文题名：Seeing down to the bottom:non-destructive inspection of all-polymer solar cells by Kelvin probe force microscopy
- 论文作者：崔泽群 ; 陈建美 ; 牛晓娜 ; 迟力峰
- 英文论文作者：Zequn Cui ; Jianmei Chen ; Xiaona Niu ; Lifeng Chi ; Institute of Functional Nano and Soft Materials(FUNSOM) ; Soochow University
- 年：2016
- 作者机构：苏州大学功能纳米与软物质研究院(FUNSOM);
- 论文关键词：开尔文探针力显微镜 ; 全聚合物太阳能电池 ; 体异质结 ; 接触电势差 ; 整电荷转移模型
- 会议召开时间：2016-07-01
- 会议录名称：中国化学会第30届学术年会摘要集-第三十五分会：纳米表征与测量
- 语种：中文
- 分类号：TM914.4;TB302.5
- 学会代码：ZGHY
- 会议名称：中国化学会第30届学术年会-第三十五分会 ; 纳米表征与测量
- 会议地点：中国辽宁大连
- 主办单位：中国化学会
- 学会名称：中国化学会
- 页数：1
- 文件大小：287k
- 原文格式：D
- 会议级别：全国
摘要
本工作基于开尔文探针力显微镜(KPFM)研究了全聚合物太阳能电池(all-PSCs)体异质结(BHJ)的底部材料组分。KPFM的测量结果呈现出四水平的接触电势差(CPD)。通过选用整电荷转移(integer charge transfer,ICT)模型进行分析,我们发现这四种CPD数值反应了体异质结的不同纵向结构。运用这种方法,通过解析CPD数据,我们可以获得体异质结的表面和底部材料组分的相分离信息。结果表明,KPFM为π共轭有机材料复合体系提供了一种简便无损的面下成像方法,可以在纳米尺度下同时获得材料体系底部的形貌和电学性质信息。
The material composition in a bulk-heterojunction(BHJ) of an all-polymer solar cell(all-PSC) is analyzed down to the bottom surface by Kelvin probe force microscopy(KPFM). A four level contrast in the contact potential difference(CPD) is observed and assigned to the different vertical mixtures of components by applying the integer charge transfer(ICT) model. The phase separation of the composites, both on the top and at the bottom of a BHJ can be measured and reconstructed with this approach. Thus, KPFM provides an easy-to-use non-destructive technique for bottom surface imaging with simultaneous structural and electronic characterization in π-conjugated organic composite systems at the nanoscale.
The material composition in a bulk-heterojunction(BHJ) of an all-polymer solar cell(all-PSC) is analyzed down to the bottom surface by Kelvin probe force microscopy(KPFM). A four level contrast in the contact potential difference(CPD) is observed and assigned to the different vertical mixtures of components by applying the integer charge transfer(ICT) model. The phase separation of the composites, both on the top and at the bottom of a BHJ can be measured and reconstructed with this approach. Thus, KPFM provides an easy-to-use non-destructive technique for bottom surface imaging with simultaneous structural and electronic characterization in π-conjugated organic composite systems at the nanoscale.
引文
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[2]Huang,Y.;Kramer,E.J.;Heeger,A.J.;Bazan,G.C.Chem.Rev.2014,114,7006.
[3]Liscio,A.;Palermo,V.;Samori?,P.Acc.Chem.Res.2010,43,541.
[4]Braun,S.;Salaneck,W.R.;Fahlman,M.Adv.Mater.2009,21,1450.