摘要
本文研究了铜铁矿结构CuAlO2薄膜的变温Raman谱和介电行为。研究结果表明:体系存在电声子耦合,声子非谐衰减是峰频移动、峰宽展宽的主要原因。介电弛豫频率随温度的上升向高频方向移动,并且弛豫过程的激活能和电输运过程的激活能基本相当,说明两者间存在紧密的关联。该结果对进一步研究铜铁矿型材料的晶体结构和应用性能具有指导意义。
引文
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