基于微通道板的二维位置灵敏像探测器X射线成像研究
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摘要
研制了一套基于微通道板的二维位置灵敏像探测器,开展了X射线成像实验研究。对游标卡尺构建的狭缝成像显示,狭缝图像清晰可见,图像的边缘分辨率能达到约500μm。对组合样品进行了成像测试,在X射线机靶流为1 m A的条件下,像探测器系统在1 ms内即可实现成像,且成像结果清晰。采用中值滤波与锐化、盲反卷积、维纳滤波等方法,对游标卡尺的成像结果进行了初步的图像处理。结果显示,三种方法都能改善图像的质量,其中维纳滤波法效果最优,相比原图边缘分辨率提高了约7%。
Developed a set of two-dimensional position sensitive detector based on micro-channel plate(MCP)and conducted a series of X-ray imaging tests. Image of Vernier-caliper proves our equipment has an edge resolution of about 500 μm. Imaging tests were carried out on the composite samples. When the X-ray machine's target ?ow was 1 mA, the clear imaging could be realized within 1 ms. Image rebuilding has also been adapted afterwards,median filtering combined with sharpen, blind deconvolution and Wiener filtering have been used respectively to reconstruct the original image of Vernier caliper. All of the three methods have a positive effect on image's quality but wiener filtering becomes the optimal method among those three which improves the edge resolution by 7%.
Developed a set of two-dimensional position sensitive detector based on micro-channel plate(MCP)and conducted a series of X-ray imaging tests. Image of Vernier-caliper proves our equipment has an edge resolution of about 500 μm. Imaging tests were carried out on the composite samples. When the X-ray machine's target ?ow was 1 mA, the clear imaging could be realized within 1 ms. Image rebuilding has also been adapted afterwards,median filtering combined with sharpen, blind deconvolution and Wiener filtering have been used respectively to reconstruct the original image of Vernier caliper. All of the three methods have a positive effect on image's quality but wiener filtering becomes the optimal method among those three which improves the edge resolution by 7%.
引文
[1]HOHEISEL M.Nucl Instr and Meth A,2006,563(1):215.
[2]HEJAZI S,TRAUERNICHT D P.Proceedings of SPIE-The International Society for Optical Engineering,1996:440.
[3]ANTONUK L E,BOUDRY J M,ELMOHRI Y,et al.Proceedings of SPIE-The International Society for Optical Engineering,1994,2163:118.
[4]QIAO W,YAN H M.Optical Instruments,2007,29(5):80.
[5]YE Qing,GUO Zhiping,ZHENG Yuhong,et al.Nuclear Technology,2000,23(2):110.(in Chinese)(叶青,郭志平,郑玉红,等.核技术,2000,23(2):110.)
[6]ZENTAI G.Comparison of CMOS and a-Si Flat Panel Imagers for X-ray Imaging[C].IEEE,2011:194.
[7]MOY J P.Nucl Instr and Meth A,2000,442(1-3):26.
[8]GYS T.Nucl Instr and Meth A,2015,787:254.
[9]PARKES W,GOTT R,POUNDS K A.IEEE Transactions on Nuclear Science,1970,17(3):360.
[10]YIN L I,TROMBKA J I,SELTZER S M.Nucl Instr and Meth,1979,158:175.
[11]SHIKHALIEV P M,DUCOTE J L,XU T,et al.IEEE Transactions on Nuclear Science,2005,52(5):1257-1262.
[12]POLAD M.SHIKHALIEV,SABEE MOLLOI.Nucl Instr and Meth A,2003,510(3):401.
[13]CRAVEN C,BENNIS D C,BOND J L,et al.PoS,2015,213:077.
[14]BLASE R C,BENKE R R,COOKE C M,et al.IEEE Transactions on Nuclear Science,2015,62(6):3339.
[15]BLASE R C,BENKE R R,PICKENS K S,et al.IEEETransactions on Nuclear Science,2018,65:1.
[16]TREMSIN A S.Neutron News,2012,23(4):35.
[17]LU N,YANG Y,LV J,et al.Physics Procedia,2012,26:61.
[18]PAN J,YANG Y,TIAN Y,et al.Journal of Instrumentation,2013,8(01):01015.
[19]LU N,YANG Y,LV J,et al.Physics Procedia,2012,26:309.
[20]TIAN Y,YANG Y G,PAN J S,et al.Chinese Physics C,2014,38(8):086003.
[21]ROSSMANN K.Radiology,1969,93(2):257.
[22]ZOU Yisong.Electrical Vacuum Imaging Device and Theoretical Analysis[M].Beijing:National Defense Industry Press,1989:230.(in Chinese)(邹异松.电真空成像器件及理论分析[M].北京:国防工业出版社,1989:230.)
[23]DAN Tangren,TIAN Jingquan,GAO Yanjun,et al.Chinese Journal of Luminescence,2002,23(06):615.(in Chinese)(但唐仁,田景全,高延军,等.发光学报,2002,23(6):615.)
[24]LAPRADE B N,REINHART S T,WHEELER M,et al.Proceedings of SPIE-The International Society for Optical Engineering,1990,1243:162.
[25]SCHMELZBACH C,SCHERBAUM F,TRONICKE J,et al.Journal of Applied Geophysics,2011,75(4):615.
[26]RUAN Qiuqi.Digital Image Processing[M].2nded.Beijing:Publishing House of Electronics Industry,2007.(in Chinese)(阮秋琦.数字图像处理学[M].2版.电子工业出版社,2007.)
[27]CHEN J,BENESTY J,HUANG Y,et al.IEEE Transactions on Audio Speech&Language Processing,2006,14(4):1218.
[28]MA Z W,LI W M,RAN J L,et al.Journal of Instrumentation,2018,13(5):05034.
[2]HEJAZI S,TRAUERNICHT D P.Proceedings of SPIE-The International Society for Optical Engineering,1996:440.
[3]ANTONUK L E,BOUDRY J M,ELMOHRI Y,et al.Proceedings of SPIE-The International Society for Optical Engineering,1994,2163:118.
[4]QIAO W,YAN H M.Optical Instruments,2007,29(5):80.
[5]YE Qing,GUO Zhiping,ZHENG Yuhong,et al.Nuclear Technology,2000,23(2):110.(in Chinese)(叶青,郭志平,郑玉红,等.核技术,2000,23(2):110.)
[6]ZENTAI G.Comparison of CMOS and a-Si Flat Panel Imagers for X-ray Imaging[C].IEEE,2011:194.
[7]MOY J P.Nucl Instr and Meth A,2000,442(1-3):26.
[8]GYS T.Nucl Instr and Meth A,2015,787:254.
[9]PARKES W,GOTT R,POUNDS K A.IEEE Transactions on Nuclear Science,1970,17(3):360.
[10]YIN L I,TROMBKA J I,SELTZER S M.Nucl Instr and Meth,1979,158:175.
[11]SHIKHALIEV P M,DUCOTE J L,XU T,et al.IEEE Transactions on Nuclear Science,2005,52(5):1257-1262.
[12]POLAD M.SHIKHALIEV,SABEE MOLLOI.Nucl Instr and Meth A,2003,510(3):401.
[13]CRAVEN C,BENNIS D C,BOND J L,et al.PoS,2015,213:077.
[14]BLASE R C,BENKE R R,COOKE C M,et al.IEEE Transactions on Nuclear Science,2015,62(6):3339.
[15]BLASE R C,BENKE R R,PICKENS K S,et al.IEEETransactions on Nuclear Science,2018,65:1.
[16]TREMSIN A S.Neutron News,2012,23(4):35.
[17]LU N,YANG Y,LV J,et al.Physics Procedia,2012,26:61.
[18]PAN J,YANG Y,TIAN Y,et al.Journal of Instrumentation,2013,8(01):01015.
[19]LU N,YANG Y,LV J,et al.Physics Procedia,2012,26:309.
[20]TIAN Y,YANG Y G,PAN J S,et al.Chinese Physics C,2014,38(8):086003.
[21]ROSSMANN K.Radiology,1969,93(2):257.
[22]ZOU Yisong.Electrical Vacuum Imaging Device and Theoretical Analysis[M].Beijing:National Defense Industry Press,1989:230.(in Chinese)(邹异松.电真空成像器件及理论分析[M].北京:国防工业出版社,1989:230.)
[23]DAN Tangren,TIAN Jingquan,GAO Yanjun,et al.Chinese Journal of Luminescence,2002,23(06):615.(in Chinese)(但唐仁,田景全,高延军,等.发光学报,2002,23(6):615.)
[24]LAPRADE B N,REINHART S T,WHEELER M,et al.Proceedings of SPIE-The International Society for Optical Engineering,1990,1243:162.
[25]SCHMELZBACH C,SCHERBAUM F,TRONICKE J,et al.Journal of Applied Geophysics,2011,75(4):615.
[26]RUAN Qiuqi.Digital Image Processing[M].2nded.Beijing:Publishing House of Electronics Industry,2007.(in Chinese)(阮秋琦.数字图像处理学[M].2版.电子工业出版社,2007.)
[27]CHEN J,BENESTY J,HUANG Y,et al.IEEE Transactions on Audio Speech&Language Processing,2006,14(4):1218.
[28]MA Z W,LI W M,RAN J L,et al.Journal of Instrumentation,2018,13(5):05034.
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