红外热成像的电子器件故障识别研究
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摘要
电子器件故障的类型多,变化复杂,使得当前电子器件故障的识别正确率低、速度慢,为了改善电子器件故障识别的效果,提出了红外热成像的电子器件故障识别方法。首先对当前电子器件故障识别研究现状进行了分析,找到引起电子器件故障识别识别效果差的原因,然后采集电子器件状态的红外热图像,并提取电子器件故障识别特征,最后采用数据挖掘技术构建电子器件故障识别器,并与其它电子器件故障识别方法进行了仿真对比实验。结果表明,本文方法能够有效识别各种电子器件故障,电子器件故障的误识率低,电子器件故障的整体识别效果要优于对比方法,具有更加广泛的应用前景。
There are many types of electronic device faults and their changes are complex,which make the current electronic device fault identification accuracy and speed slow. In order to improve the effect of electronic device fault identification,the infrared thermal imaging method of electronic device fault identification is proposed. Firstly,the current status of electronic device fault identification is analyzed,and the reasons for the poor effect of electronic device fault identification are found. Then the infrared thermal image of electronic device state is collected,and the fault identification features of electronic device are extracted. Finally,the fault identifier of electronic device is constructed by data mining technology,and the electronic device is compared with it. The fault recognition method is simulated and compared. The results show that this method can identify all kinds of electronic device faults,the accuracy of electronic device fault identification is low,the overall recognition effect of electronic device faults is better than the comparison method,and has a wider application prospect.
There are many types of electronic device faults and their changes are complex,which make the current electronic device fault identification accuracy and speed slow. In order to improve the effect of electronic device fault identification,the infrared thermal imaging method of electronic device fault identification is proposed. Firstly,the current status of electronic device fault identification is analyzed,and the reasons for the poor effect of electronic device fault identification are found. Then the infrared thermal image of electronic device state is collected,and the fault identification features of electronic device are extracted. Finally,the fault identifier of electronic device is constructed by data mining technology,and the electronic device is compared with it. The fault recognition method is simulated and compared. The results show that this method can identify all kinds of electronic device faults,the accuracy of electronic device fault identification is low,the overall recognition effect of electronic device faults is better than the comparison method,and has a wider application prospect.
引文
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[12]刘锦铭,赵伟超,康帅,等.红外热成像技术在设备故障诊断中的应用[J].科技传播,2014,6(10):129-130.
[13]马学涛.电子电路功率器件故障特征参数提取技术综述[J].电子世界,2017,9(1):48-50.
[14]任磊,韦徵,龚春英,等.电力电子电路功率器件故障特征参数提取技术综述[J].中国电机工程学报,2015,35(12):3089-3101.
[15]罗云林,章翔.基于红外热成像与集成SVM的航空器电子板卡故障检测[J].测控技术,2012,31(12):41-44+48.
[2]刘爽,牟龙华,许旭锋,等.电力电子器件故障对微电网运行可靠性的影响[J].电力系统保护与控制,2017,45(24):63-70.
[3]刘元林,梅晨,唐庆菊,等.红外热成像检测技术研究现状及发展趋势[J].机械设计与制造,2015,11(6):260-262,266.
[4]靳齐,江民福.浅议红外热成像仪在通信电源系统故障分析中的应用[J].中国新通信,2018,20(15):33.
[5]吕昂,陈怡,方晋甬,等.基于红外热成像的电路板载器件故障检测[J].激光与红外,2018,48(5):579-584.
[6]赵鑫祥.电力设备红外热成像全测温故障诊断研究[J].工业控制计算机,2018,31(1):36-38.
[7]汪长亮,陶照宇,程德,等.基于红外热成像的避雷器故障诊断[J].安徽电气工程职业技术学院学报,2014,19(1):32-34.
[8]邵进,胡武炎,贾风鸣,等.红外热成像技术在电力设备状态检修中的应用[J].高压电器,2013,49(1):126-129,133.
[9]余长国,刘航,魏钢.输变电设备红外热成像自动识别及故障分析系统[J].四川兵工学报,2012,33(12):108-110.
[10]张赢.电力设备故障的红外热成像诊断[J].东北电力技术,2010,31(12):33-35.
[11]孙卉.应用红外热成像技术诊断电气设备故障[J].石油和化工设备,2009,12(2):37-40.
[12]刘锦铭,赵伟超,康帅,等.红外热成像技术在设备故障诊断中的应用[J].科技传播,2014,6(10):129-130.
[13]马学涛.电子电路功率器件故障特征参数提取技术综述[J].电子世界,2017,9(1):48-50.
[14]任磊,韦徵,龚春英,等.电力电子电路功率器件故障特征参数提取技术综述[J].中国电机工程学报,2015,35(12):3089-3101.
[15]罗云林,章翔.基于红外热成像与集成SVM的航空器电子板卡故障检测[J].测控技术,2012,31(12):41-44+48.