基于Wiener过程的功率变换器剩余寿命评估方法
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摘要
针对功率变换器难以准确建立表征其性能退化过程物理模型的问题,提出一种基于Wiener随机过程的剩余寿命评估方法实现其剩余寿命预测。通过分析电路关键元器件退化对电路性能的影响,选用输出电压均值为DC-DC变换电路失效特征参数,利用Wiener过程建立电路性能退化模型,通过逐步递推预测寿命特征参数值并结合电路失效阈值从而实现功率变换器剩余寿命预测。以闭环SEPIC电路为例,分析了建模数据与建模尺度对剩余寿命预测结果的影响,实验验证了该方法的有效性。
Aiming at the challenge of the difficulty in obtaining the accurate mathematical representations of power converters,in this paper,a method based on Wiener random process is proposed,which is used to realize the remaining useful life prediction. This paper analyzes the influence of the key components of the circuit on the circuit performance,selects the average output voltage to be the characteristic parameter,then,uses the method of Wiener process to establish the fault trend model. The remaining useful life prediction of the power converter is realized by step-by-step recurrent,parameters with the failure threshold of the circuit. The closed-loop SEPIC circuit is taken as an example in this study and the influence of the modeling data and size on the prediction results are conducted. Experiment results show that this method is effective.
Aiming at the challenge of the difficulty in obtaining the accurate mathematical representations of power converters,in this paper,a method based on Wiener random process is proposed,which is used to realize the remaining useful life prediction. This paper analyzes the influence of the key components of the circuit on the circuit performance,selects the average output voltage to be the characteristic parameter,then,uses the method of Wiener process to establish the fault trend model. The remaining useful life prediction of the power converter is realized by step-by-step recurrent,parameters with the failure threshold of the circuit. The closed-loop SEPIC circuit is taken as an example in this study and the influence of the modeling data and size on the prediction results are conducted. Experiment results show that this method is effective.
引文
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[2]Sun Quan,Wang Youren,Jiang Yuanyuan,et al. On-line component-level soft fault diagnostics for power converters[C]. Prognostics and System Health Management Conference,Chengdu,China,2016:1-5.
[3]周雒维,吴军科,杜雄,等.功率变流器的可靠性研究现状及展望[J].电源学报,2013,11(1):1-15.
[4]Sikorska J Z,Hodkiewicz M,Ma L. Prognostic modeling options for remaining useful life estimation by industry[J]. Mechanical Systems and Signal Processing,2011,25(5):1803-1836.
[5]Celaya J R,Kulkarni C,Saha S,et al. Accelerated aging in electrolytic capacitors for prognostics[C]. Annual Reliability and Maintainability Symposium(RAMS),Reno,USA,2012.
[6]Celaya J R,Saxena A,Kulkarni C S,et al. Prognostics approach for power MOSFET under thermal-stress aging[C]. Annual Reliability and Maintainability Symposium(RAMS),Reno,USA,2012.
[7]胡友涛,胡昌华,孔祥玉,等.基于WSVR和FCM聚类的实时寿命预测方法[J].自动化学报,2012,38(3):331-340.
[8]贾占强,蔡金燕,梁玉英,等.基于综合环境加速寿命试验的电子装备故障预测研究[J].电子学报,2009,36(6):1277-1282.