Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy

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• 作者：Kiwon Moon ; Hongkyu Park ; Jeonghoi Kim ; Youngwoong Do ; Soonsung Lee ; Gyuseok Lee ; Hyeona Kang ; Haewook Han
• 刊名：Nano Letters
• 出版年：2015
• 出版时间：January 14, 2015
• 年：2015
• 卷：15
• 期：1
• 页码：549-552
• 全文大小：296K
• ISSN：1530-6992

文摘

Combined with terahertz (THz) time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the subsurface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to 鈭嘉?3300, at 1 THz, while the AFM only provides a flat surface topography.