Stoichiometry and structural refinement of liquid-phase epitaxial grown LiNb_1−xTa_xO₃ films on LiNbO₃ substrates

详细信息    查看全文

• 作者：Kaigawa ; Kazuyuki ; Yamamura ; Yoshihiko ; Kumazawa ; Youichiro ; Kawaguchi ; Tatsuo ; Imaeda ; Minoru ; et. al.
• 关键词：77.84.Dy ; 81.15.Lm ; 68.55.&minus ; a ; 61.72.Dd ; A1. High resolution X-ray diffraction ; A1. Interface ; A3. Liquid phase epitaxy ; B1. Lithium compounds ; B1. Niobates ; B2. Nonlinear optic materials
• 刊名：Journal of Crystal Growth
• 出版年：2002
• 出版时间：September, 2002
• 年：2002
• 卷：244
• 期：1
• 页码：78-87
• 全文大小：544 K

文摘

The quantitative analysis of Li content in the liquid-phase epitaxial (LPE) grown LiNb_1−xTa_xO₃ (LNT) film by combining high-resolution X-ray diffractometry (HR-XRD) and electron probe microanalysis (EPMA) is proposed. The X-ray rocking curves of the LNT films grown on LiNbO₃ (LN) substrates are simulated, and then the interface sharpness is analyzed. The combination of HR-XRD and EPMA reveals that the Li content in the LNT films increases with decreasing growth temperature. The simulation of rocking curves suggests that the LNT/LN films do not have the thick fluctuation layer in Li content, but they have Nb/Ta interdiffusion layers at the interfaces. The activation energy can be estimated from an Arrhenius plot of the calculated diffusion coefficients.